Hierarchical identification of NBTI-critical gates in nanoscale logic
statement of authorship
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, ... [et al.]
location of publication
[S.l.]
publisher
year of publication
pages
[6] p. : ill
conference name, date
15th IEEE Latin-American Test Workshop, March 12-15, 2014
conference location
Fortaleza, Brazil
ISBN
978-1-4799-4711-9
notes
Bibliogr.: 13 ref
TTÜ department
language
inglise
subject term
keyword
Kostin, S., Raik, J., Ubar, R., Jenihhin, M. et al. Hierarchical identification of NBTI-critical gates in nanoscale logic // LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014. [S.l.] : IEEE, 2014. [6] p. : ill.