Teaching advanced test issues in digital electronics
statement of authorship
Raimund Ubar, Elmet Orasson, Jaan Raik, Heinz-Dietrich Wuttke
source
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
location of publication
[S.l.]
publisher
year of publication
pages
p. S2B-1 - S2B-6 : ill
conference name, date
6th IEEE International Conference on Information Technology Based Higher Education and Training, July 7-9, 2005
conference location
Juan Dolio, Dominican Republic
ISBN
0-7803-9141-1
notes
Biobliogr.: 11 ref
TTÜ department
language
inglise
subject term
keyword
Ubar, R.-J., Orasson, E., Raik, J., Wuttke, H.-D. Teaching advanced test issues in digital electronics // Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic. [S.l.] : IEEE, 2005. p. S2B-1 - S2B-6 : ill.