How to generate high quality tests for digital systems
statement of authorship
R. Ubar, M. Aarna, H. Kruus, J. Raik
source
2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2
location of publication
[S.l.]
publisher
year of publication
pages
p. 459-462 : ill
ISBN
0-7803-8499-7
notes
Bibliogr.: 11 ref
TTÜ department
language
inglise
subject term
keyword
Ubar, R.-J., Aarna, M., Kruus, H., Raik, J. How to generate high quality tests for digital systems // 2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2. [S.l.] : IEEE, 2004. p. 459-462 : ill.