A novel random approach to diagnostic test generation
statement of authorship
Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik
location of publication
Piscataway
publisher
year of publication
pages
[4] p. : ill
conference name, date
2nd IEEE NORCAS Conference, 1-2 November, 2016
conference location
Copenhagen, Denmark
ISBN
978-1-5090-1095-0
notes
Bibliogr.: 14 ref
TTÜ department
language
inglise
keyword
Osimiry, E.O., Ubar, R., Kostin, S., Raik, J. A novel random approach to diagnostic test generation // 2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark. Piscataway : IEEE, 2016. [4] p. : ill.