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In-field detection of degradation on PCB assembly high-speed buses

author
Odintsov, Sergei
statement of authorship
Sergei Odintsov
source
IEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings
location of publication
Piscataway
publisher
IEEE
year of publication
2018
pages
6 p.: ill
conference name, date
IEEE AUTOTESTCON 2018, National Harbor, September 17-20, 2018
conference location
Maryland, USA
url
https://doi.org/10.1109/AUTEST.2018.8532547
subject term
töökindlus
vead
järelevalve
subject of form
konverentsikogumikud
keyword
failure analysis
printed circuits
reliability
ISSN
1558-4550
ISBN
978-1-5386-5223-7
notes
Bibliogr.: 11 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Odintsov, S. In-field detection of degradation on PCB assembly high-speed buses // IEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings. Piscataway : IEEE, 2018. 6 p.: ill. https://doi.org/10.1109/AUTEST.2018.8532547