Guarnieri, V., Hantson, H., Raik, J., Jenihhin, M., Ubar, R.

full record print

On the reuse of TLM mutation analysis at RTL

author

Guarnieri, Valerio

Hantson, Hanno

Raik, Jaan

Jenihhin, Maksim

Ubar, Raimund-Johannes

statement of authorship

Valerio Guarnieri, ... Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar [et al.]

source

Journal of electronic testing : theory and applications

journal volume number month

Vol. 28, 4

year of publication

2012

pages

p. 435-448 : ill

ISSN

0923-8174

notes

Bibliogr.: 35 ref

language

inglise

Märksõnad ja võtmesõnad

keyword

mutation analysis

mutation testing

systemC

transaction-level modeling

Guarnieri, V., Hantson, H., Raik, J., Jenihhin, M., Ubar, R. On the reuse of TLM mutation analysis at RTL // Journal of electronic testing : theory and applications (2012) Vol. 28, 4, p. 435-448 : ill.