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1
book article
Method for testing the brain
Hinrikus, Hiie
;
Bachmann, Maie
;
Lass, Jaanus
;
Tuulik, Viiu
;
Ubar, Raimund-Johannes
5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary
2012
/
p. 1198-1201 : ill
book article
2
book article
On BTI aging rejuvenation in memory address decoders
Gürsoy, Cemil Cem
;
Kraak, Daniel
;
Ahmed, Foisal
;
Taouil, Mottaqiallah
;
Jenihhin, Maksim
;
Hamdioui, Said
2022 IEEE 23rd Latin American Test Symposium, LATS 2022
2022
/
Code 184360
https://doi.org/10.1109/LATS57337.2022.9936940
book article
3
book article
Software-based mitigation for memory address decoder aging
Kraak, D. H. P.
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704595
book article
Number of records 3, displaying
1 - 3
keyword
29
1.
activation memory
2.
cache memory
3.
Digital Object Memory
4.
learning and memory
5.
long short term memory
6.
long short -term memory (LSTM)
7.
long short-term memory (LSTM)
8.
long-short term memory
9.
long-short-term memory (LSTM)
10.
material with memory
11.
memory
12.
memory architecture
13.
memory effect
14.
memory efficiency
15.
memory interconnect test
16.
memory kernels
17.
memory management
18.
memory network
19.
memory systems
20.
memory testing
21.
memory-induced resonance
22.
National memory
23.
non-volatile memory
24.
processing-in-memory
25.
random access memory
26.
relaxed memory
27.
shape memory alloy
28.
Shape memory alloys
29.
shape memory efect
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