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A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs

author
statement of authorship
Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui
source
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
publisher
year of publication
pages
p. 792-797
conference name, date
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE 2020), 9 to 13 March, 2020
conference location
Grenoble, France
url
ISBN
978-3-9819263-4-7
notes
Bibliogr.: 24 ref
TTÜ department
language
inglise
subject term
keyword
FinFET
SRAM
hard-to-detect faults
defects
DFT
memory testing
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Cardoso Medeiros, G., Gürsoy, C.C., Fieback, M., Jenihhin, M. et al. A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. : EDAA, 2020. p. 792-797. https://doi.org/10.23919/DATE48585.2020.9116278