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Re-using chip level DFT at board level

author
Gu, Xinli
Jutman, Artur
statement of authorship
Xinli GU, ... Artur Jutman, ... [et al.]
source
location of publication
Los Alimitos
publisher
year of publication
pages
1 p
conference name, date
2012 17th IEEE European Test Symposium (ETS),May 28th–June 1st, 2012
conference location
Annecy, France
ISBN
978-1-4673-0697-3
language
inglise
keyword
board test
board diagnosis
chip access
IEEE P1687
IEEE 1149.1
Gu, X., Jutman, A. et al. Re-using chip level DFT at board level // Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France. Los Alimitos : IEEE Computer Society, 2012. 1 p.