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1
book article
A new FPGA-based detection method for spurious variations in PCBA power distribution network
Odintsov, Sergei
;
Bozzoli, Ludovica
;
De Sio, Corrado
;
Sterpone, Luca
;
Jutman, Artur
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/DDECS.2019.8724662
book article
2
book article
Re-using chip level DFT at board level
Gu, Xinli
;
Jutman, Artur
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France
2012
/
1 p
book article
Number of records 2, displaying
1 - 2
keyword
141
1.
board test
2.
processor-centric board test
3.
Board and System Test
4.
board
5.
board composition
6.
board diagnosis
7.
board diversity
8.
board of directors
9.
Estonian Police and Border Guard Board (PPA)
10.
laminate embedded printed circuit board
11.
off-board charger
12.
on-board charger (OBC)
13.
processor-centric board
14.
single board computer
15.
accelerated shelf-life test
16.
adaptive test strategy generation
17.
antigen test
18.
ASTM G65 dry sand rubber wheel abrasion test
19.
automated test environment
20.
automated test pattern generation
21.
automatic test case generation
22.
automatic test pattern generation
23.
automatic test program generation
24.
Auvergne test-bed
25.
battery test
26.
behavioral test
27.
behaviour level test generation
28.
bending test
29.
bit-error rate test
30.
bounds test
31.
built-in self-test
32.
capillary condensation redistribution test
33.
chi-square test
34.
closed bottle test
35.
cognitive screening test
36.
compartment fire test
37.
compartment test
38.
cone penetration test (CPT)
39.
COVID-19 antigen test
40.
cutting test
41.
cybersecurity test bed
42.
DDR4 interconnect test
43.
design and test
44.
design-for-test
45.
deterministic test sequences
46.
diagnostic test
47.
digital test
48.
Digital test and testable design
49.
double-pulse test
50.
drawing test
51.
dry droplet antimicrobial test
52.
embedded test
53.
fan pressurisation test
54.
final test result prediction
55.
four-point bending test
56.
FPGA based test
57.
FPGA-Assisted Test
58.
FPGA-centric test
59.
functional self-test
60.
functional test generation
61.
Granger causality test
62.
hardness test
63.
high-level synthesis for test
64.
high-level test data generation
65.
highlevel test generation
66.
high-speed serial link test
67.
IEEE 9 bus test system
68.
implementation-independent test generation
69.
in situ tensile test in SEM
70.
industrial field test
71.
in-situ tensile test in SEM
72.
Johansen cointegration test
73.
Kolmogorov-Smirnov test
74.
load test
75.
logic built-in self-test
76.
Luria alternating series test
77.
Mann–Kendall test
78.
memory interconnect test
79.
microprocessor test
80.
Model test
81.
multiplier test
82.
offline test generation
83.
orthogonal test
84.
package test analysis
85.
parallel design and test
86.
performance test
87.
piezocone penetration test (CPTu)
88.
Point Load Test index
89.
pressurisation test
90.
provably correct test generation
91.
pseudo-exhaustive test
92.
purity test
93.
rtioco-based timed test sequences
94.
seasonal Mann Kendall test
95.
self-test
96.
self-test architectures
97.
sentence writing test
98.
serial sevens test
99.
ship towing test tank
100.
similar material simulation test
101.
small‐scale test
102.
software based self-test
103.
software-based self-test
104.
software-based self-test (SBST)
105.
soil phosphorus (P) test
106.
standard test method
107.
static load test
108.
static-dynamic probing test (SDT)
109.
stress test
110.
system level test
111.
teaching design and test of systems
112.
tensile test
113.
test
114.
test and evaluation platform
115.
test bench
116.
test coverage
117.
test driven development
118.
test driven modelling
119.
test embankment
120.
test equipment
121.
test generation
122.
test generation and fault diagnosis
123.
test groups
124.
test model design
125.
test optimization
126.
test packets
127.
test path synthesis
128.
test patterns
129.
test point insertion
130.
test program generation
131.
test reference year
132.
test replication
133.
test scenario description language
134.
test-bed
135.
test-chips
136.
test-house
137.
test-pattern
138.
test-suite reduction
139.
Three-point bending test
140.
unit root test
141.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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