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Jenihhin, Maksim 1981
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126
book article
RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and quality
Vierhaus, Heinrich Theodor
;
Jenihhin, Maksim
;
Sonza Reorda, Matteo
2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 2018
2018
/
p. 45-50 : ill
https://doi.org/10.1109/EWME.2018.8629465
book article
127
book article
A rescue demonstrator for interdependent aspects of reliability, security and quality towards a complete EDA flow
Raik, Jaan
;
Jenihhin, Maksim
Proceedings of the 2020 Design, Automation & Test in Europe Conference &Exhibition (DATE 2020), 9 to 13 March, 2020, Grenoble, France
2020
/
p. 58
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=9116424
book article
128
book article
RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design
Gürsoy, Cemil Cem
;
Cardoso Medeiros, Guilherme
;
Chen, Juanho
;
Balakrishnan, Aneesh
;
Lai, Xinhui
;
Bagbaba, Ahmet Cagri
;
Raik, Jaan
;
Jenihhin, Maksim
DATE 2019
2019
/
1 p. : ill
https://doi.org/10.5281/zenodo.3362529
https://past.date-conference.com/
book article
129
book article
RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems
Jenihhin, Maksim
;
Raik, Jaan
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
art. 19690741 , 6 p
https://doi.org/10.23919/DATE48585.2020.9116558
book article
130
book article
Sequential circuits BIST synthesis from signal specifications
Raik, Jaan
;
Jenihhin, Maksim
;
Adelbert, Rain
Proceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 2005
2005
/
p. 196-199 : ill
book article
131
dissertation
Simulation-based hardware verification with high-level decision diagrams = Simuleerimisel põhinev riistvara verifitseerimine kõrgtaseme otsustusdiagrammidel
Jenihhin, Maksim
2008
https://www.ester.ee/record=b2431332*est
dissertation
132
book article
Simulation-based verification with APRICOT framework using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
East-West Design & Test Symposium : Moscow, September 18-21, 2009
2009
/
p. 13-16 : ill
book article
133
book article
Software-based mitigation for memory address decoder aging
Kraak, D. H. P.
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704595
book article
134
book article
Software-level TMR approach for on-board data processing in space applications
Janson, Karl
;
Treudler, Carl Johann
;
Hollstein, Thomas
;
Raik, Jaan
;
Jenihhin, Maksim
;
Fey, Goerschwin
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 147-152 : ill
https://doi.org/10.1109/DDECS.2018.00033
book article
135
book article EST
/
book article ENG
Special session : AutoSoC - a suite of open-source automotive SoC benchmarks
Silva, Felipe Augusto da
;
Bagbaba, Ahmet Cagri
;
Ruospo, Annachiara
;
Jenihhin, Maksim
2020 IEEE 38th VLSI TEST SYMPOSIUM (VTS) - VTS 2020 : proceedings
2020
/
9 p. : ill
https://doi.org/10.1109/VTS48691.2020.9107599
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
136
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
137
journal article EST
/
journal article ENG
A survey on UAV computing platforms : a hardware reliability perspective
Ahmed, Foisal
;
Jenihhin, Maksim
Sensors
2022
/
art. 6286
https://doi.org/10.3390/s22166286
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
138
book article
SystemC-based loose models : RTL abstraction for design understanding
Abrar, Syed Saif
;
Jenihhin, Maksim
;
Raik, Jaan
Workshop on Design Automation for Understanding Hardware Designs DUHDe 2015 : Grenoble, March 13, 2015
2015
/
p. 1-6
book article
139
book article
SystemC-based loose models for simulation speed-up by abstraction of RTL IP cores
Abrar, Syed Saif
;
Jenihhin, Maksim
;
Raik, Jaan
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 71-74 : ill
http://dx.doi.org/10.1109/DDECS.2015.39
book article
140
book article
zamiaCAD : open source platform for advanced hardware design
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2011 University Booth : Design Automation and Test in Europe : Grenoble, France, March 14-18, 2011
2011
/
[2] p.: ill
book article
141
book article
zamiaCAD : shall we dance?
Jenihhin, Maksim
Open Source Tools for Verification : DVClub 14 January 2013
2013
/
1 p
book article
142
book article
zamiaCAD : understand, develop and debug hardware designs
Jenihhin, Maksim
;
Tihhomirov, Valentin
;
Saif Abrar, Syed
;
Raik, Jaan
;
Bartsch, Günter
DUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany
2014
/
p. 1-6
book article
143
book article
Temporally extended high-level decision diagrams for PSL assertions simulation
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy
2008
/
p. 61-68 : ill
book article
144
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
145
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
book article
146
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
book article
147
book article
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Jenihhin, Maksim
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p
https://doi.org/10.1109/NORCHIP.2019.8906974
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
148
book article
Timing-critical path analysis with structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Jenihhin, Maksim
;
Raik, Jaan
;
Olugbenga, Niyi-Leigh
;
Viies, Vladimir
2018 7th Mediterranean Conference on Embedded Computing (MECO)
2018
/
6 p. : ill
https://doi.org/10.1109/MECO.2018.8406051
book article
149
book article
Towards multidimensional verification : where functional meets non-functional
Jenihhin, Maksim
;
Lai, Xinhui
;
Ghasempouri, Tara
;
Raik, Jaan
2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore
2018
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2018.8573495
book article
Seotud publikatsioonid
1
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
150
book article
True path tracing in structurally synthesized BDDs for testability analysis of digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
2019
/
p. 492-499 : ill
https://doi.org/10.1109/DSD.2019.00077
book article
Number of records 159, displaying
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1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Gorev, Maksim
6.
Maksim, Antonov
7.
Maksim, I.
8.
Maksim, Tiit
9.
Mõttus, Maksim
10.
Ošeka, Maksim
11.
Radzvilovits, Maksim
12.
Ruchkin, Maksim
13.
Saat, Maksim
14.
Säkki, Maksim
15.
Zelenski, Maksim
CV
9
1.
Jenihhin, Maksim 1981
2.
Antonov, Maksim 1978
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim 1988
8.
Saat, Maksim 1944
9.
Säkki, Maksim 1977
name of the person
6
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Saat, Maksim
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