Test time minimization for hybrid BIST with test pattern broadcasting
statement of authorship
Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng
location of publication
[S. l.]
year of publication
pages
p. 112-116 : ill
ISBN
87-982637-5-7
notes
Bibliogr.: 11 ref
Ubar, R.-J., Jenihhin, M., Jervan, G., Peng, Z. Test time minimization for hybrid BIST with test pattern broadcasting // IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings. [S. l.], 2003. p. 112-116 : ill.