print

True path tracing in structurally synthesized BDDs for testability analysis of digital circuits

author
Ubar, Raimund-Johannes
Jürimägi, Lembit
Oyeniran, Adeboye Stephen
Jenihhin, Maksim
statement of authorship
Raimund Ubar, Lembit Jürimägi, Adeniyi Olanrewaju Adekoya, Maksim Jenihhin
source
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
location of publication
Danvers
publisher
IEEE
year of publication
2019
pages
p. 492-499 : ill
conference name, date
22nd Euromicro Conference on Digital System Design, DSD 2019, 28 - 30 August 2019
conference location
Kallithea, Chalkidiki, Greece
url
https://doi.org/10.1109/DSD.2019.00077
subject term
digitaalintegraallülitused
digitaaltehnika
otsustusdiagrammid
keyword
combinational circuits
signal probabilities
controllability
testability
fault redundancy
structurally synthesized BDDs
ISBN
978-1-7281-2861-0
978-1-7281-2863-4
notes
Bibliogr.: 25 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Ubar, R., Jürimägi, L., Oyeniran, A. S., Jenihhin, M. True path tracing in structurally synthesized BDDs for testability analysis of digital circuits // Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings. Danvers : IEEE, 2019. p. 492-499 : ill. https://doi.org/10.1109/DSD.2019.00077