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Jenihhin, Maksim 1981
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151
book article
TTBist: a DfT tool for enhancing functional test for SoC
Hermann, K.
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 191-194 : ill
book article
152
journal article
Tööstusdoktorantuur projektis RESCUE
Jenihhin, Maksim
Mente et Manu
2017
/
lk. 21
http://www.ester.ee/record=b1242496*est
journal article
153
journal article EST
/
journal article ENG
Understanding multidimensional verification : where functional meets non-functional
Lai, Xinhui
;
Balakrishnan, Aneesh
;
Lange, Thomas
;
Jenihhin, Maksim
;
Ghasempouri, Tara
;
Raik, Jaan
;
Alexandrescu, Dan
Microprocessors and microsystems
2019
/
art. 102867, 13 p. : ill
https://doi.org/10.1016/j.micpro.2019.102867
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
2
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
154
book article
Universal mitigation of NBTI-induced aging by design randomization
Jenihhin, Maksim
;
Kamkin, Alexander
;
Navabi, Zainalabedin
;
Sadeghi-Kohan, Somayeh
Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016
2017
/
[5] p. : ill
http://dx.doi.org/10.1109/EWDTS.2016.7807635
book article
155
book article
Unsupervised recycled FPGA detection using symmetry analysis
Tarique, Tanvir Ahmad
;
Ahmed, Foisal
;
Jenihhin, Maksim
;
Ali, Liakot
12th International Conference on Electrical and Computer Engineering : ICECE 2022
2022
/
p. 437-440
https://doi.org/10.1109/ICECE57408.2022.10088856
book article
156
book article
Upgrading QoSinNoC : efficient routing for mixed-criticality applications and power analysis
Avramenko, Serhiy
;
Azad, Siavoosh Payandeh
;
Violante, Massimo
;
Niazmand, Behrad
;
Raik, Jaan
;
Jenihhin, Maksim
Proceedings of the 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 8-10, 2018, Verona, Italy
2018
/
p. 207-212 : ill
https://doi.org/10.1109/VLSI-SoC.2018.8644866
book article
157
book article
Using simulation statistics for bug localization in RTL designs
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 107-110 : ill
book article
158
book article
Wafer-level die re-test success prediction using machine learning
Selg, Hardi
;
Jenihhin, Maksim
;
Ellervee, Peeter
21st IEEE Latin-American Test Symposium (LATS) 2020 : proceedings
2020
/
5 p
https://doi.org/10.1109/LATS49555.2020.9093672
book article
159
book article
VHDL design debug framework based on zamiaCAD
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France
2013
/
[1] p. : ill
book article
Number of records 159, displaying
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Jenihhin, Maksim
2.
Andrijaškin, Maksim
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Antonov, Maksim
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Butsenko, Maksim
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Gorev, Maksim
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Maksim, Antonov
7.
Maksim, I.
8.
Maksim, Tiit
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Mõttus, Maksim
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Ošeka, Maksim
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Radzvilovits, Maksim
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Ruchkin, Maksim
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Saat, Maksim
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Säkki, Maksim
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Zelenski, Maksim
CV
9
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Jenihhin, Maksim 1981
2.
Antonov, Maksim 1978
3.
Butsenko, Maksim
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Gazizov, Maksim 1918
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Oseka, Maksim
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Osheka, Maksim
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Ošeka, Maksim 1988
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Saat, Maksim 1944
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Säkki, Maksim 1977
name of the person
6
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Saat, Maksim
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