Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Advanced search
My bookmarks
0
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TTÜ subject term
TTÜ department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
Add criteria
Simple search
filter
Clear
×
Authors from search
Jenihhin, Maksim 1981
CV
author
supervisor
editor
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
159
Look more..
(3/30)
Export
export all inquiry results
(159)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
76
journal article
Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
Jenihhin, Maksim
;
Squillero, Giovanni
;
Tihhomirov, Valentin
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 273-289 : ill
http://dx.doi.org/10.1007/s10836-016-5589-x
journal article
77
book article
Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits
Jenihhin, Maksim
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania
2015
/
[1] p
book article
78
book article
Identifying NBTI-critical paths in nanoscale logic
Ubar, Raimund-Johannes
;
Vargas, Fabian
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
;
Bolzani Poehls, Leticia
16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain
2013
/
p. 136-141 : ill
book article
79
journal article
Identifying untestable faults in sequential circuits using test path constraints
Viilukas, Taavi
;
Karputkin, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Journal of electronic testing : theory and applications (JETTA)
2012
/
p. 511-521 : ill
journal article
80
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
81
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
82
book article
Implementation-independent test generation for a large class of faults in RISC processor modules
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Raik, Jaan
;
Ubar, Raimund-Johannes
24th Euromicro Conference on Digital System Design (DSD)
2021
https://doi.org/10.1109/DSD53832.2021.00090
book article
83
book article
An iterative approach to test time minimization for parallel hybrid BIST architecture
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Z.
5th IEEE Latin-American Test Workshop - LATW 2004 : Cartagena, Colombia, 2004 : digest of papers
2004
/
p. 98-103 : ill
book article
84
book article
An iterative approach to test time minimization for parallel hybrid BIST architectures
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Z.
System-on-Chip Conference 2004 : Bastad, Sweden
2004
/
p. ?
book article
85
book article
JÄNES : a NAS framework for ML-based EDA applications
Selg, Hardi
;
Jenihhin, Maksim
;
Ellervee, Peeter
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
2021
https://doi.org/10.1109/DFT52944.2021.9568321
book article
86
book article
Layout to logic defect analysis for hierarchical test generation
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Rakowski, Michal
Proceedings of the 2007 IEEE Workshop on Design and Diagnostic Circuits and Systems : April 11-13, 2007, Krakow, Poland
2007
/
p. 35-40 : ill
http://dx.doi.org/10.1109/DDECS.2007.4295251
book article
87
book article
Localization of bugs in processor designs using zamiaCAD framework
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
13th International Workshop on Microprocessor Test and Verification (MTV 2012) Common Challenges and Solutions : Austin, USA, December 10–12, 2012
2012
/
p. 1-6
book article
88
book article
Measuring and identifying aging-critical paths in FPGAs
Pfeifer, Petr
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Pliva, Zdenek
MEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France
2015
/
p. 56-61 : ill
book article
89
book article
A methodology for automated mining of compact and accurate assertion sets
Heidari Iman, Mohammadreza
;
Raik, Jaan
;
Jenihhin, Maksim
;
Jervan, Gert
;
Ghasempouri, Tara
2021 IEEE Nordic Circuits and Systems Conference (NorCAS) : Oslo, Norway, October 26-27
2021
/
7 p. : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9599865
https://doi.org/10.1109/NorCAS53631.2021.9599865
book article
90
journal article
Mixed hierarchical-functional fault models for targeting sequential cores
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
;
Jenihhin, Maksim
Journal of systems architecture
2008
/
3/4, p. 465-477 : ill
journal article
91
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
92
book article
MLC: a machine learning based checker for soft error detection in embedded processors
Nosrati, Nooshin
;
Jenihhin, Maksim
;
Navabi, Zainalabedin
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
2022
/
Code 183305
https://doi.org/10.1109/IOLTS56730.2022.9897309
Article at Scopus
Article at WOS
book article
93
book article
Modeling for multi-view interference analysis of design aspects in MPSoC designs
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
RESCUE 2017 : Workshop on Reliability, Security and Quality : ETS17 Fringe Workshop, May 25-26, 2017, Limassol, Cyprus
2017
/
p. 1-6
http://www.ets17.org.cy/workshop/rescue-workshop.html
book article
94
book article
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Jenihhin, Maksim
2019 NASA/ESA conference on adaptive hardware and systems AHS 2019 : proceedings
2019
/
p. 72-78 : ill
https://doi.org/10.1109/AHS.2019.00007
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
95
book article
Modeling microprocessor faults on high-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
;
Istenberg, Martin
;
Wuttke, Heinz-Dietrich
DSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska
2008
/
p. C17-C22 : ill. [CD-ROM]
book article
96
book article
Modeling soft-error reliability under variability
Balakrishnan, Aneesh
;
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Alexandrescu, Dan
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
2021
/
p. 1-6
https://doi.org/10.1109/DFT52944.2021.9568295
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
97
book article
Multi-fragment Markov model guided online test generation for MPSoC
Vain, Jüri
;
Tsiopoulos, Leonidas
;
Kharchenko, Vyacheslav
;
Apneet Kaur
;
Jenihhin, Maksim
;
Raik, Jaan
ICTERI 2017 : ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer : proceedings of the 13th International Conference on ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer, Kyiv, Ukraine, May 15-18, 2017
2017
/
p. 594-607 : ill
http://www.scopus.com/inward/record.uri?eid=2-s2.0-85020540459&partnerID=40&md5=af226e25c344c52689f23bf5c39cc267
http://ceur-ws.org/Vol-1844/10000594.pdf
book article
98
book article
Multi-view modeling for MPSoC design aspects [Online resource]
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600986
book article
99
book article
Mutation analysis for systemC designs at TLM
Guarnieri, Valerio
;
Bombieri, Nicola
;
Pravadelli, Graziano
;
Fummi, Franco
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
2011
/
[6] p
book article
100
book article
Mutation analysis with high-level decision diagrams
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
;
Guglielmo, Giuseppe di
;
Fummi, Franco
LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay
2010
/
[6] p. [CD-ROM]
book article
Number of records 159, displaying
76 - 100
previous
1
2
3
4
5
6
7
next
author
15
1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Gorev, Maksim
6.
Maksim, Antonov
7.
Maksim, I.
8.
Maksim, Tiit
9.
Mõttus, Maksim
10.
Ošeka, Maksim
11.
Radzvilovits, Maksim
12.
Ruchkin, Maksim
13.
Saat, Maksim
14.
Säkki, Maksim
15.
Zelenski, Maksim
CV
9
1.
Jenihhin, Maksim 1981
2.
Antonov, Maksim 1978
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim 1988
8.
Saat, Maksim 1944
9.
Säkki, Maksim 1977
name of the person
6
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Saat, Maksim
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT