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reliability (keyword)
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51
book article EST
/
book article ENG
Special session: approximation and fault resiliency of DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Barbareschi, Mario
;
Barone, Salvatore
;
Bosio, Alberto
;
Daneshtalab, Masoud
;
Torca, Salvatore Della
;
Gavarini, Gabriele
;
Jenihhin, Maksim
;
Raik, Jaan
;
Taheri, Mahdi
Proceedings 2023 IEEE 41st VLSI Test Symposium (VTS)
2023
/
10 p. : ill
https://doi.org/10.1109/VTS56346.2023.10140043
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
52
book article
Study of MOSFET post-fault operation in fault-tolerant DC-DC converters
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Vinnikov, Dmitri
2022 IEEE 7th International Energy Conference (ENERGYCON)
2022
/
Code 181231, 5 p
https://doi.org/10.1109/ENERGYCON53164.2022.9830216
book article
Seotud publikatsioonid
1
Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
53
book article EST
/
book article ENG
Supply chain quality improvement based on customer compliance
Maas, Rene
;
Shevtshenko, Eduard
;
Karaulova, Tatjana
Technological Innovation for Connected Cyber Physical Spaces : 14th IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems, DoCEIS 2023, Caparica, Portugal, July 5–7, 2023 : proceedings
2023
/
p. 230 - 242
https://doi.org/10.1007/978-3-031-36007-7_17
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
54
journal article EST
/
journal article ENG
Using STLs for effective in-field test of GPUs
Rodriguez Condia, Josie E.
;
Da Silva, Felipe Augusto
;
Bagbaba, Ahmet Cagrl
;
Guerrero-Balaguera, Juan-David
;
Hamdioui, Said
;
Sauer, Christian
;
Reorda, Matteo Sonza
IEEE Design and Test
2023
/
p. 109-117
https://doi.org/10.1109/MDAT.2022.3188573
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
55
journal article EST
/
journal article ENG
Wear-out failure analysis of an impedance-source PV microinverter based on system-level electrothermal modeling
Shen, Yanfeng
;
Chub, Andrii
;
Wang, Huai
;
Vinnikov, Dmitri
;
Liivik, Elizaveta
;
Blaabjerg, Frede
IEEE transactions on industrial electronics
2019
/
p. 3914-3927
https://doi.org/10.1109/TIE.2018.2831643
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
56
book article
Wear-out failure analysis of solar optiverter operating with 60- and 72-cell Si crystalline PV modules
Liivik, Liisa
;
Chub, Andrii
;
Sangwongwanich, Ariya
;
Shen, Yanfeng
;
Vinnikov, Dmitri
;
Blaabjerg, Frede
IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society : proceedings
2018
/
p. 6134-6140 : ill
https://doi.org/10.1109/IECON.2018.8592925
book article
Number of records 56, displaying
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1.
cross-layer reliability
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engineering reliability operational probabilities
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framework of reliability estimation
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high reliability leadership
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high reliability management
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high reliability organizations
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materials reliability
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Network reliability
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power system reliability
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process reliability
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reliability
12.
reliability analysis
13.
Reliability engineering
14.
reliability optimization
15.
reliability prediction
16.
reliability verification
17.
semiconductor device reliability
18.
soft-error reliability
19.
substation reliability
20.
system reliability
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