Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

cross-layer reliability (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publication ..

year

year of publication

Loading..

Loading..

TTÜ department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 2
Look more.. (2/134)
Export

export all inquiry results (2)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

journal article EST / journal article ENG

A survey on UAV computing platforms : a hardware reliability perspectiveAhmed, Foisal; Jenihhin, MaksimSensors2022 / art. 6286 https://doi.org/10.3390/s22166286 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
2

journal article EST / journal article ENG

Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applicationsCherezova, Natalia; Shibin, Konstantin; Jenihhin, Maksim; Jutman, ArturMicroelectronics reliability2023 / art. 115010, 10 p. : ill https://doi.org/10.1016/j.microrel.2023.115010 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Number of records 2, displaying 1 - 2

1. cross-layer reliability
2. cross-layer
3. cross-layer fault tolerance
4. engineering reliability operational probabilities
5. framework of reliability estimation
6. high reliability leadership
7. high reliability management
8. high reliability organizations
9. materials reliability
10. Network reliability
11. power system reliability
12. process reliability
13. reliability
14. reliability analysis
15. Reliability engineering
16. reliability optimization
17. reliability prediction
18. reliability verification
19. semiconductor device reliability
20. soft-error reliability
21. substation reliability
22. system reliability
23. absorber layer
24. abstraction layer
25. additive layer manufacturing
26. atomic layer deposition
27. atomic layer deposition (ALD)
28. bottom boundary layer
29. boundary layer
30. buffer layer
31. Cd-free buffer layer
32. composite layer
33. deep layer
34. double-layer capacitance
35. Ekman layer
36. electric double-layer
37. electron transport layer
38. Equivalent single layer
39. glaze layer
40. interface layer
41. layer growing curvature method
42. layer removing
43. layer-wise displacement theory
44. MAC layer
45. maximal two-layer exchange
46. mechanically mixed layer (MML)
47. monograin layer solar cell
48. monograin layer solar cells
49. network layer
50. oxide layer
51. physical layer
52. seed layer
53. selenium capping layer
54. SiO2 interface layer
55. sub-maximal two-layer exchange
56. zero-strenght-layer
57. zero‐strength layer
58. zero-strength layer
59. zero‐strength layer
60. ZnS buffer layer
61. thin layer chromatography
62. Thin layer chromatography (TLC)
63. thin-layer chromatography
64. thin-layer rendering
65. thin-layer rendering system
66. thin-layer rendering systems
67. tribo-layer
68. upper mixed layer
69. bay of parabolic cross-section
70. bay with a parabolic cross-section
71. bays of parabolic cross-section
72. channels of variable cross-section
73. cross border
74. cross correlation
75. cross laminated timber
76. cross mediation
77. cross subsidisation
78. cross validation
79. cross-border
80. cross-border communication networks
81. cross-border data exchange
82. cross-border e-government
83. cross-border e-services
84. cross-border integration
85. cross-border mobilit
86. cross-border public services
87. cross-border services
88. cross-border spillovers
89. cross-checking
90. cross-correlation
91. cross-country
92. cross-country comparison
93. cross-coupling reactions
94. cross-cultural communication
95. cross-cultural competences
96. cross-cultural differences
97. cross-cultural management
98. cross-cultural study
99. crossdependencies
100. cross-disciplinary
101. cross-enterprise
102. Cross-Entropy method
103. cross-governmental cooperation
104. Cross-Impact Matrix Multiplication Applied Classification (MICMAC)
105. cross-innovation
106. Cross-kingdom RNAi
107. cross-lagged analysis
108. cross-laminated timber
109. cross‐laminated timber
110. cross-language analysis
111. cross-layered fault management
112. cross-linguality
113. cross-linking
114. cross-linking polymerscross-linking polymers
115. cross-order harmonic coupling
116. cross-organizational
117. cross-section
118. cross-sectoral collaboration
119. cross-sectoral innovation
120. cross-sectorial innovation
121. cross-shore jets
122. cross-shore profile
123. effective cross section method
124. effective cross-section method
125. electronic cross-communication
126. intrastate and cross-border social movements
127. metallographic cross section
128. protein cross-linking
129. reduced cross-section method
130. sonogashira cross-coupling
131. Suzuki cross-coupling
132. Trans-European cross-border corridors
133. two-photon cross section

1. Cross, Sam

vaste

sort

Otsing
Valikud 0

year of publication

author

TTÜ department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digikogu Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu