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Jutman, Artur (author)
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126
book article
Simulation-based equivalence checking between IEEE 1687 ICL and RTL
Damljanovic, Aleksa
;
Jutman, Artur
;
Portolan, Michele
;
Tšertov, Anton
2019 IEEE International Test Conference (ITC)
2019
/
paper. 7.3, 8 p. : ill
https://doi.org/10.1109/ITC44170.2019.9000181
book article
127
book article
SoC and board modeling for processor-centric board testing
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings
2011
/
p. 575-582 : ill
https://ieeexplore.ieee.org/document/6037463
book article
128
book article
SSBDD model : advantageous properties and efficient simulation algorithms
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
ETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest
2002
/
p. 345-346 : ill
book article
129
book article
SSBDDs : advantageous model and efficient algorithms for digital circuit modeling, simulation & test
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
5th International Workshop on Boolean Problems : September 19-20, 2002, Freiberg (Sachsen) : proceedings
2002
/
p. 157-166 : ill
book article
130
book article
Structural fault collapsing by superposition of BDDs for test generation in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
2010
/
p. 250-257 : ill
https://ieeexplore.ieee.org/document/5450451
book article
131
book article
Structurally synthesized binary decision diagrams
Jutman, Artur
;
Peder, Ahti
;
Raik, Jaan
;
Tombak, Mati
;
Ubar, Raimund-Johannes
Boolean Problems : 6th International Workshop : September 23-24, 2004, Freiberg
2004
/
p. 271-278 : ill
book article
132
book article
Structurally synthesized multiple input BDDs for simulation of digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 2009
2009
/
p. 451-454 : ill
http://dx.doi.org/10.1109/ICECS.2009.5410895
book article
133
book article
Structurally synthesized multiple input BDDs for speeding up logic-level simulation of digital circuits
Mironov, Dmitri
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
;
Jutman, Artur
13th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2010 : Lille, France, 1-3 September 2010 : proceedings
2010
/
p. 658-663 : ill
book article
134
book article
A suite of IEEE 1687 benchmark networks
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
2016 IEEE International Test Conference (ITC) : proceedings
2016
/
art. 6.1, p. 1-10 : ill
https://doi.org/10.1109/TEST.2016.7805840
book article
135
book article
Synchronization, calibration and triggering of IEEE 1687 embedded instruments
Jutman, Artur
;
Devadze, Sergei
;
Shibin, Konstantin
The Seventeenth Workshop on RTL and High Level Testing (WRTLT'16) : November 24-25, 2016, Aki Grand Hotel, Hiroshima, Japan
2016
/
[6] p
book article
136
dissertation
System modeling for processor-centric test automation = Süsteemide modelleerimine protsessorikesksete testprogrammide sünteesi automatiseerimiseks
Tšertov, Anton
2012
https://www.ester.ee/record=b2751131*est
dissertation
137
book article
System-wide fault management based on IEEE P1687 IJTAG
Shibin, Konstantin
;
Jutman, Artur
;
Devadze, Sergei
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa
2012
/
p. 81-84 : ill
book article
138
book article
Teaching digital RT-level self-test using a Java applet
Devadze, Sergei
;
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
2002
/
p. 322-328 : ill
book article
139
book article
Teaching digital test with BIST analyzer
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 123-128 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
book article
140
journal article
Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols
Bengtsson, Tomas
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Zebo
IET computers and digital techniques
2008
/
6, p. 445-460
journal article
141
book article
Testing beyond the SoCs in a lego style
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
2010
/
p. 334-338 : ill
https://ieeexplore.ieee.org/document/5742052
book article
142
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
143
book article
Testing tools for training and education
Balaž, M.
;
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 12th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2005 : Krakow, Poland, 22-25 June, 2005. Vol. 1 of 2
2005
/
p. 671-676 : ill
book article
144
book article
The synthesis level in Bloom's taxonomy - a nightmare for an LMS
Wuttke, Heinz-Dietrich
;
Ubar, Raimund-Johannes
;
Henke, Karsten
;
Jutman, Artur
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 199-204 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610186
book article
145
book article
Timing simulation of digital circuits with binary decision diagrams
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Z.
Design, Automation and Test in Europe : Conference and Exhibition 2001 : Munich, Germany, March 13-16, 2001 : proceedings
2001
/
p. 460-466 : ill
https://ieeexplore.ieee.org/document/915063
book article
146
book article
Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BIST
Petlenkov, Eduard
;
Jutman, Artur
;
Nõmm, Sven
;
Ubar, Raimund-Johannes
CIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 2008
2008
/
p. 99-104 : ill
https://ieeexplore.ieee.org/document/4595841
book article
147
book article
Trainer 1149 : a boundary scan simulation bundle with hardware support for labs
Shibin, Konstantin
;
Jutman, Artur
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 135-138 : ill
book article
148
book article
Trainer 1149: a boundary scan simulation bundle for labs
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Shibin, Konstantin
;
Rosin, Vjatšeslav
MIXDES 2011 : 18th International Conference "Mixed Design of Integrated Circuits and Systems" : June 16-18, 2011, Gliwice, Poland
2011
/
p. 520-525
book article
149
journal article
Turbo tester - diagnostic package for research and training
Aarna, Margit
;
Ivask, Eero
;
Jutman, Artur
;
Orasson, Elmet
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Vislogubov, Vladislav
;
Wuttke, Heinz-Dietrich
Radioelectronics and informatics
2003
/
p. 69-73 : ill
journal article
150
book article
Turning JTAG inside out for fast extended test access
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil
2009
/
[6] p. : ill
https://ieeexplore.ieee.org/document/4813799
book article
Number of records 161, displaying
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33
1.
Jutman, Artur
2.
Jutman, Valentin
3.
Abdullin, Artur
4.
Abels, Artur
5.
Adson, Artur
6.
Alliksaar, Artur
7.
Binczewski, Artur
8.
Dahlberg, Artur
9.
Hain, Artur
10.
Izumrudov, Artur
11.
Jugaste, Artur
12.
Jõgi, Artur
13.
Jürvetson, Artur
14.
Keller, Artur
15.
Kivikas, Artur
16.
Klauson, Artur
17.
Lavrov, Artur
18.
Leetberg, Artur
19.
Liefländer, Artur
20.
Linari-Linholm, Artur
21.
Lobov, Artur
22.
Luha, Artur Heinrich
23.
Medvid, Artur
24.
Mägi, Artur
25.
Nilson, Artur
26.
Noole, Artur
27.
Puksov, Artur
28.
Rieger, Artur
29.
Ruszczak, Artur
30.
Rätsep, Artur
31.
Talvik, Artur
32.
Toikka, Artur
33.
Tooman, Artur
CV
25
1.
Jutman, Artur 1976
2.
Jutman, Valentin 1938
3.
Georgin, Artur 1891-1954
4.
Hain, Artur 1925-2011
5.
Jõgi, Artur 1978
6.
Klauson, Artur 1995
7.
Laksberg, Artur 1975
8.
Lavrov, Artur 1999
9.
Leetberg, Artur 1886-1969
10.
Leetna, Karl Artur
11.
Liefländer, Artur
12.
Linari, Artur-Aleksander
13.
Linari-Linholm, Artur A. 1903-1983
14.
Luha, Artur Heinrich 1892-1953
15.
Luhha, Artur Heinrich
16.
Mitsulis, Artur 1981
17.
Mitšulis, Artur
18.
Noole, Artur 1985
19.
Perna, Artur (-1939)
20.
Perna, Artur 1881-1940
21.
Pihlak, Artur Aleksander 1885-1941
22.
Pärna, Artur 1915-1943
23.
Sagarov, Artur
24.
Toikka, Artur 1998
25.
Šagarov, Artur
name of the person
21
1.
Jutman, Artur
2.
Andersalu, Artur
3.
Georgin, Artur Mihkel, 1891-1954
4.
Hain, Artur
5.
Lavrov, Artur
6.
Lessner, Artur
7.
Linari-Linholm, Artur, 1903-1983
8.
Lind, Artur
9.
Lind, Artur, 1927-1989
10.
Luha, Artur Heinrich, 1892-1953
11.
Mihhailov, Artur
12.
Noole, Artur
13.
Ojasalu, Artur
14.
Perna, Artur, 1881-1940
15.
Pihlak, Artur-Aleksander, 1885-1941
16.
Prees, Artur
17.
Pärna, Artur
18.
Saaliste, Artur
19.
Sagarov, Artur
20.
Talvik, Artur, 1964-
21.
Vassar, Artur, 1911-1977
subject term
1
1.
Artur Uin ja Ko, veinitööstus
TTÜ subject term
1
1.
Perna, Artur, 1881-1940
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