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Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs (title)
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book article EST
/
book article ENG
Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Orasson, Elmet
;
Raik, Jaan
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
2016
/
p. 23-45 : ill
https://doi.org/10.1007/978-3-319-46097-0_2
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
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book article ENG
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keyword
6
1.
fault equivalence and dominance
2.
conditional fault collapsing
3.
fault collapsing
4.
fault analysis
5.
fault analysis model
6.
fault tree analysis
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