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book article

Double phase fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Adeboye StephenDSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal2015 / p. 700-705 : ill

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Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill https://doi.org/10.1007/978-3-319-46097-0_2 Conference Proceedings at Scopus Article at Scopus Article at WOS

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Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

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Number of records 3, displaying 1 - 3

1. fault equivalence and dominance
2. abuse of dominance
3. collective dominance
4. dominance
5. dominance ratio
6. national provision prohibiting abuses of dominance
7. contextual equivalence
8. equivalence ratio
9. functional equivalence principle
10. input-output equivalence transformations
11. program equivalence
12. state equivalence
13. transfer equivalence
14. asynchronous fault detection
15. automatic fault diagnosis
16. bearing fault diagnosis
17. bi-directional fault monitoring devices
18. conditional fault collapsing
19. control fault models
20. critical path fault tracing
21. cross-layer fault tolerance
22. cross-layered fault management
23. extended fault class
24. fault currents
25. fault analysis
26. fault analysis model
27. fault classification
28. fault classification
29. fault collapsing
30. fault compensation
31. fault coverage
32. fault current and voltage measurements
33. Fault current limite
34. fault current limiter
35. fault detection
36. fault detection and diagnoses
37. fault detection and diagnosis
38. fault diagnosis
39. fault diagnostic
40. fault diagnostic resolution
41. fault diagnostics
42. fault dignosis
43. fault effects
44. fault emulation
45. fault handling
46. fault handling strategy
47. fault indicator
48. fault injection
49. Fault Injection Simulation
50. fault Interruption
51. fault localization
52. fault location
53. fault management
54. fault masking
55. fault modeling
56. fault models
57. fault monitoring
58. fault prediction
59. fault protection
60. fault redundancy
61. fault resilience
62. fault ride through
63. Fault ride through enhancement
64. fault signal
65. fault simulastion
66. fault simulation
67. fault simulation with critical path tracing
68. fault tolerance
69. fault tolerant
70. fault tolerant control
71. fault tolerant operation
72. fault tolerant router design
73. fault tolerant systems
74. Fault Tree Analysis
75. fault-injection attack
76. fault-plane solution
77. fault-resilience
78. fault-resistant
79. fault-ride-through (FRT)
80. fault-tolerance
81. fault-tolerant
82. Fault-tolerant (FT) converters
83. fault-tolerant control
84. fault-tolerant converter
85. functional fault model
86. high-level control fault model
87. high-level fault coverage
88. high-level fault model
89. high-level fault simulation
90. high-level functional fault model
91. Katun fault
92. low-level fault redundancy
93. no fault found
94. No-Fault-Found
95. open circuit fault
96. parallel fault-simulation
97. short circuit fault
98. spectrum-based fault localization
99. stacking fault
100. stuck-at fault model
101. test generation and fault diagnosis
102. transient fault mitigation
103. transmission lines fault

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