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176

book article

Diagnostic modelling of digital systems with binary and high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Kruus, Helena; Lensen, Harri; Evartson, TeetProgress in industrial mathematics at ECMI 20062008 / p. 902-907 : ill https://link.springer.com/chapter/10.1007/978-3-540-71992-2_158

book article

177

journal article

Diagnostic modelling of digital systems with decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета : приложение2004 / август, материалы международных, всесоюзных и региональных научных конференций, симпозиумов, школ, проводимых в ТГУ, с. 174-179 : ил

journal article

178

book article

Diagnostic modelling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Evartson, Teet; Kruus, Margus; Lensen, HarriProceedings of the 17th IASTED International Conference on Modelling and Simulation : May 24-26, 2006, Montreal, Quebec, Canada2006 / p. 207-212 : ill

book article

179

book article

Diagnostic softwareUbar, Raimund-JohannesConcise encyclopedia of software engineering1993 / p. 101-105

book article

180

book article

Diagnostic software with WEB interface for teaching purposesVislogubov, Vladislav; Jutman, Artur; Kruus, Helena; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 255-258 : ill

book article

181

book article

Diagnostic test generation for statistical bug localization using evolutionary computationGaudesi, Marco; Jenihhin, Maksim; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesApplications of Evolutionary Computation : 17th European Conference, EvoApplications 2014, Granada, Spain, April 23-25, 2014 : revised selected papers2014 / p. 425-436 : ill

book article

182

book article

DIAGNOZER : a laboratory tool for teaching research in diagnosis of electronic systems [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Jutman, Artur; Raik, Jaan; Wuttke, Heinz-Dietrich2009 IEEE International Conference on Microelectronic Systems Education MSE '09 : 25-27 July 2009, San Francisco, California : [proceedings]2009 / p. 12-15 : ill. [CD-ROM] http://dx.doi.org/10.1109/MSE.2009.5270842

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183

book

Digitaalarvutite operatsioonseadmed : õppevahendUbar, Raimund-Johannes1978 https://www.ester.ee/record=b1313974*est

book

184

book

Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est

book

185

book article

Digitaalsüsteemide diagnostika Tallinna TehnikaülikoolisUbar, Raimund-JohannesTeadusmõte Eestis : tehnikateadused2002 / lk. 107-113 : ill

book article

186

book article

Digital design flow with test activitiesDiener, Karl-Heinz; Elst, G.; Ivask, Eero; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

book article

187

book article

Digital design learning system based on Java appletsJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes4th Annual Conference of the LTSN Centre for Information and Computer Sciences : 26th-28th August 2002, NUI Galway, Ireland2003 / p. 183-187 : ill https://pld.ttu.ee/dildis/publications/Sudnitson%20LTSN-ICS%202003.pdf

book article

188

journal article

Digital electronics design and test at Computer Engineering Department of Tallinn University of TechnologyUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Ellervee, PeeterThe house magazine : the parlamentary weekly2006 / 1198, p. 42 : ill

journal article

189

book article

Digital logic simulation with compressed BDDsUbar, Raimund-Johannes; Mironov, Dmitri; Devadze, Sergei; Raik, JaanProceedings : 2011 IEEE International Conference on Computer Science and Automation Engineering : June 10-12, 2011, Shanghai, China2011 / p. 105-109 : ill https://ieeexplore.ieee.org/document/5952643

book article

190

dissertation

Digital test in WEB-based environmentIvask, Eero2006 https://www.ester.ee/record=b2158119*est

dissertation

191

book article

Distance learning tools for the field of electronics design and testUbar, Raimund-JohannesITHET 2003 proceedings : 4th International Conference on Information Technology based Higher Education and Training : July 7-9, 2003, Marrakech, Morocco2003 / p. 285-290 : ill

book article

192

book article

Distance-learning tools for digital design and test issuesJutman, Artur; Kruus, Margus; Sudnitsõn, Aleksander; Ubar, Raimund-JohannesIT+SE'2002 : Information Tec[h]nologies in Science, Education, Telecommunication, Business : proceedings = Информационные технологии в науке, образовании, телекоммуникации, бизнесе, Украина, Крым, Ялта-Гурзуф, 20-30 мая 2002 года : труды2002 / p. 269-272 : ill

book article

193

book article

Distributed approach for genetic test generation in the field of digital electronicsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIntelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 20082008 / p. 127-136

book article

194

book article

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesMIXDES 2010 : 17th International Conference "Mixed Design of Integrated Circuits and Systems" : June 24-26, 2010, Wroclaw, Poland2010 / p. 471-476 : ill

book article

195

journal article

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesInternational journal of microelectronics and computer science2010 / p. 165-174 : ill

journal article

196

journal article

Distributed fault simulation with collaborative load balancing for VLSI circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesScalable computing : practice and experience2011 / p. 153-163 : ill

journal article

197

newspaper article

Doktoritest ja professoritestUbar, Raimund-JohannesTehnikaülikool1993 / 17. märts, lk. 7 https://www.ester.ee/record=b5309277*est

newspaper article

198

book article

DOT: new deterministic defect-oriented ATPG toolRaik, Jaan; Ubar, Raimund-Johannes; Sudbrock, Joachim; Kuzmicz, Wieslaw; Pleskacz, Witold A.European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings2005 / p. 96-101 : ill

book article

199

book article

Double phase fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Adeboye StephenDSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal2015 / p. 700-705 : ill

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200

book article

Dynamic analysis of digital circuits with 5-valued simulationUbar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 187-192: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_29

book article

Ubar, Raimund-Johannes (TTÜ author)

types of item

CV 63

author 57

name of the person 28

subject term 1