Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Advanced search

Velmre, Enn (TTÜ author)

—

—

Add criteria Simple search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publication ..

year

year of publication

Loading..

Loading..

TTÜ department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 175
Look more.. (3/142)
Export

export all inquiry results (175)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
76

journal article

Numerical modeling of the electrothermal transient process in diode structures based on direct-cap-semiconductorsVelmre, Enn; Freidin, BorisPhysica status solidi. A, Applied research1983 / p. K131-K134 https://www.ester.ee/record=b1562026*est

journal article
77

journal article

Numerical simulation of a forward-based p-i-n structure with band-to-band Auger recombinationFreidin, Boris; Velmre, EnnElectronics letters : an international publication1978 / p. 701-703 https://www.ester.ee/record=b2180432*est

journal article
78

book article

Numerical simulation of a silicon carbide diodeVelmre, Enn; Udal, AndresBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 559-566: ill https://www.ester.ee/record=b2150914*est

book article
79

book article

Numerical simulation of electrothermal effects in ESD protection devicesHellstrom, S.; Freidin, Boris; Velmre, Enn; Udal, AndresTechn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwabisch Gmünd, Germany1992

book article
80

book article

Numerical simulation of electrothermal interactions in semiconductors under electrostatic energy pulse conditionsFreidin, Boris; Velmre, Enn; Udal, AndresTechn. Dig. of International Workshop on Computational Electronics, 1992 May 28-29, Beckman Institute, Univ.of Illinois at Urbana Champain, USA1992

book article
81

journal article

Pooljuhid läbi aegadeVelmre, EnnHorisont1974 / lk. 15-19 : ill.; 7 lk. 26-28 : ill.; 9 lk. 24-27 https://www.digar.ee/arhiiv/et/perioodika/69737 https://www.digar.ee/arhiiv/et/perioodika/69744 https://www.ester.ee/record=b1072243*est https://www.digar.ee/arhiiv/et/perioodika/69745

journal article
82

journal article

Power diode transicent characteristics modeling in inductive load circuitsFreidin, Boris; Velmre, Enn; Udal, AndresThe Bug Exterminator (USA)1991 / 3, p. 1-5: fig

journal article
83

book article

Quantum mechanical transforms between [hii]- and [kapa]-space as a signal processing problemUdal, Andres; Kukk, Vello; Velmre, Enn; Klopov, MihhailBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 71-74 : ill

book article
84

journal article

Raamatu tekkeloostVelmre, EnnElektriala2022 / lk. 27 https://www.ester.ee/record=b1240496*est

journal article
Seotud publikatsioonid 1
- Tallinna kaupmehepojast füüsikaklassikuks : Thomas Johann Seebeck 1770-1831
85

book article

SaateksVelmre, EnnTallinna kaupmehepojast füüsikaklassikuks : Thomas Johann Seebeck 1770-18312022 / lk. 13-17 https://www.ester.ee/record=b5519213*est

book article
86

book article

SiC-diode forward surge current failure mechanisms : experiment and simulationVelmre, Enn; Udal, AndresESREF'97 : proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Oct. 7-10, 1997, Bordeaux, France1997 / p. 1671-1674

book article
87

journal article

SiC-diodes forward surge current failure mechanisms : experiment and simulationUdal, Andres; Velmre, EnnMicroelectronics and reliability1997 / 10/11, p. 1671-1674

journal article
88

book article

Study of radiative recombination influence in GaN and GaAs bipolar transistor structuresVelmre, Enn; Udal, Andres; Verbitski, IrinaBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 59-62 : ill

book article
89

book article

Tallinna kaupmehe pojast füüsikaklassikuks. Thomas Johann Seebeck (1770-1831)Velmre, EnnVana Tallinn. XXIII (XXVII)2012 / lk. 274-286 : ill

book article
Seotud publikatsioonid 2
- Tallinna kaupmehepojast füüsika klassikuks
- Monograafia kuulsaimast Eesti loodusteadlasest
90

book

Tallinna kaupmehepojast füüsikaklassikuks : Thomas Johann Seebeck 1770-1831Velmre, Enn2022 https://www.ester.ee/record=b5519213*est

book
Seotud publikatsioonid 2
- Raamatu tekkeloost
- Ilmunud on monograafia ühest kuulsaimast Eesti juurtega loodusteadlasest
91

book

TEA entsüklopeedia2012 https://www.ester.ee/record=b2869027*est

book
92

book

TEA entsüklopeedia2011 https://www.ester.ee/record=b2666688*est

book
93

book

TEA entsüklopeedia2011 https://www.ester.ee/record=b2712813*est

book
94

book article

Termoelektri avastaja Thomas Johann Seebeck : [ettekanne rahvusvahelisel seminaril 11. mail 2007 TTÜs]Velmre, EnnTallinna Tehnikaülikooli aastaraamat 20072008 / lk. 335-339

book article
95

book article

The experimental results of reverse recovery effects in power fastrecovery diodes analyzed by numerical modelVelmre, Enn; Udal, Andres; Vaher, G.T.; Tarma, MatiProceedings International AEGEAN Conference on Electrical Machines and Power Electronics, Kusadasi 27-29 May, 19921992 / p. 738-743: fig

book article
96

book article

Thermopower measurements in 4H-SiC and Theoretical calculations considering the phonon drag effectGrivickas, V.; Stölzer, M.; Velmre, Enn; Udal, Andres; Grivickas, P.; Syväjärvi, M.; Yakimova, R.; Bikbajevas, V.Abstracts of the 3rd European Conference on Silicon Carbide and Related Materials : ECSCRM'2000 : Sept. 3-7, 2000, Kloster Banz, Germany2000 / p. 144

book article
97

book article

Thermopower measurements in 4H-SiC and theoretical calculations considering the phonon drag effectGrivickas, V.; Stölzer, M.; Velmre, Enn; Udal, Andres; Grivickas, P.; Syväjärvi, M.; Yakimova, R.; Bikbajevas, V.Silicon Carbide and Related Materials : ECSCRM2000 : proceedings of the 3rd European Conference on Silicon Carbide and Related Materials : Kloster Banz, Germany, September 20002001 / p. 491-494 : ill https://www.researchgate.net/publication/240833914_Thermopower_Measurements_in_4H-SiC_and_Theoretical_Calculations_Considering_the_Phonon_Drag_Effect

book article
98

journal article

Thomas J. Seebeck 250 : tänased mikro- ja nanoelektroonika lahendused toetuvad tuntumaile Eestis sündinud täppisteadlaseleHärmat, KarinMente et Manu2020 / lk. 64-65 : ill https://www.ttu.ee/public/m/mente-et-manu/MM_01_2020/mobile/index.html https://www.ester.ee/record=b1242496*est

journal article
99

journal article

Thomas J. Seebeck 250 : tänased mikro- ja nanoelektroonika lahendused toetuvad tuntumaile Eestis sündinud täppisteadlaseleHärmat, KarinElektriala2020 / lk. 24-25 http://www.ester.ee/record=b1240496*est

journal article
100

book

Thomas Johann Seebeck (1770-1831)2007 http://www.ester.ee/record=b2285820*est

book

Number of records 175, displaying 76 - 100

previous
1
2
3
4
5
6
7
next

vaste

sort

Otsing
Valikud 0

year of publication

author

TTÜ department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digikogu Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu