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Lange, Thomas (author)
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1
book article
Composing graph theory and deep neural networks to evaluate SEU type soft error effects
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Jenihhin, Maksim
9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 2020
2020
https://doi.org/10.1109/MECO49872.2020.9134279
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
2
book article
Enabling cross-layer reliability and functional safety assessment through ML-based compact models
Alexandrescu, Dan
;
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition
2020
/
6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159750
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
3
book article
Gate-level graph representation learning : a step towards the improved stuck-at faults analysis
Balakrishnan, Aneesh
;
Alexandrescu, Dan
;
Jenihhin, Maksim
;
Lange, Thomas
;
Glorieux, Maximilien
Proceedings of the Twenty Second International Symposium on Quality Electronic Design (ISQED) : Santa Clara, USA, 7-9 April 2021
2021
/
p. 24-30
https://doi.org/10.1109/ISQED51717.2021.9424256
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
4
book article
Machine learning clustering techniques for selective mitigation of critical design features
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition
2020
/
7 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159751
book article
5
book article
Machine learning to tackle the challenges of transient and soft errors in complex circuits
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece
2019
/
p. 7-14 : ill
https://doi.org/10.1109/IOLTS.2019.8854423
book article
6
book article
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Jenihhin, Maksim
2019 NASA/ESA conference on adaptive hardware and systems AHS 2019 : proceedings
2019
/
p. 72-78 : ill
https://doi.org/10.1109/AHS.2019.00007
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
7
book article
On antagonism between side-channel security and soft-error reliability in BNN inference engines
Lai, Xinhui
;
Lange, Thomas
;
Balakrishnan, Aneesh
;
Alexandrescu, Dan
;
Jenihhin, Maksim
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)
2021
/
p. 1-6
https://doi.org/10.1109/VLSI-SoC53125.2021.9606981
book article
Seotud publikatsioonid
1
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
8
book article
On the estimation of complex circuits functional failure rate by machine learning techniques
Lange, Thomas
;
Balakrishnan, Aneesh
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Sterpone, Luca
49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings
2019
/
p. 35-41 : ill
https://doi.org/10.1109/DSN-S.2019.00021
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
9
journal article
Tau lepton identification and reconstruction : a new frontier for jet-tagging ML algorithms
Lange, Thomas
;
Nandan, Saswati
;
Pata, Joosep
;
Tani, Laurits
;
Veelken, Christian
Computer physics communications
2024
/
art. 109095
https://doi.org/10.1016/j.cpc.2024.109095
journal article
Seotud publikatsioonid
1
Measurement of Higgs boson properties in leptonic final states using ML-methods = Higgsi bosoni omaduste mõõtmine leptoneid sisaldavates kanalites kasutades masinõppe meetodeid
10
journal article
Tau lepton identification and reconstruction : a new frontier for jet-tagging ML algorithms : [preprint]
Lange, Thomas
;
Nandan, Saswati
;
Pata, Joosep
;
Tani, Laurits
;
Veelken, Christian
arXiv.org
2023
/
22 p. : ill
https://doi.org/10.48550/arXiv.2307.07747
journal article
Seotud publikatsioonid
1
Measurement of Higgs boson properties in leptonic final states using ML-methods = Higgsi bosoni omaduste mõõtmine leptoneid sisaldavates kanalites kasutades masinõppe meetodeid
11
book article
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
Balakrishnan, Aneesh
;
Lange, Thomas
;
Glorieux, Maximilien
;
Alexandrescu, Dan
;
Jenihhin, Maksim
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p
https://doi.org/10.1109/NORCHIP.2019.8906974
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
12
journal article EST
/
journal article ENG
Understanding multidimensional verification : where functional meets non-functional
Lai, Xinhui
;
Balakrishnan, Aneesh
;
Lange, Thomas
;
Jenihhin, Maksim
;
Ghasempouri, Tara
;
Raik, Jaan
;
Alexandrescu, Dan
Microprocessors and microsystems
2019
/
art. 102867, 13 p. : ill
https://doi.org/10.1016/j.micpro.2019.102867
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
2
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
Number of records 12, displaying
1 - 12
author
97
1.
Lange, Thomas
2.
Lange, A.
3.
Lange, David
4.
Lange, E.
5.
Lange, Frederik
6.
Lange, Lene
7.
Lange, Moritz
8.
Lange, O.
9.
Lange, Steffen
10.
Lange, Sven
11.
Salvia, Amanda Lange
12.
Ambrosio, Thomas
13.
Angerer, Thomas
14.
Ashton, Thomas
15.
Badewien, Thomas H.
16.
Bauschert, Thomas
17.
Browne, Thomas
18.
Brunoe, Thomas D.
19.
Carlqvist, Thomas
20.
Carlsson, Thomas
21.
Carrington, Thomas
22.
Clauss, Thomas
23.
Clavel, Thomas
24.
Condra, Thomas J.
25.
Daubon, Thomas
26.
Diemant, Thomas
27.
Ditlev Brunoe, Thomas
28.
Dittrich, Thomas
29.
Duve, Thomas
30.
Estermann, Thomas
31.
Fehniger, Thomas Edward
32.
Folegot, Thomas
33.
Gentzis, Thomas
34.
Gesecke, Thomas
35.
Giesecke, Thomas
36.
Gruber, Thomas
37.
Hammarklint, Thomas
38.
Hantschel, Thomas
39.
Henneron, Thomas
40.
Henschel, Thomas
41.
Hoffmann, Thomas
42.
Hollstein, Thomas
43.
Howard, Thomas
44.
Howard, Thomas J.
45.
Hutchinson, Thomas
46.
Hübner, Thomas
47.
Jacob, Thomas
48.
Kimmer, Thomas
49.
Koch, Frank-Thomas
50.
Kuhn, Thomas S.
51.
Kusch, Thomas
52.
Lampoltshammer, Thomas J.
53.
Lavergne, Thomas
54.
Leclercq, Thomas
55.
Lepik, Thomas
56.
Lorenz, Thomas
57.
Mathä, Thomas Y.
58.
Mayer, Thomas
59.
Meincke, Thomas
60.
Meyer, Thomas
61.
Mitchell, Thomas J.
62.
Moeslund, Thomas B.
63.
Mörs, Thomas
64.
Müller, Thomas
65.
Neumann, Thomas
66.
Nilsson, Thomas
67.
Obst, Thomas
68.
Palm, Thomas
69.
Pedersen, Thomas
70.
Plitz, Thomas
71.
Ratha, Thomas
72.
Reitz, Thomas
73.
Reuter, Thomas
74.
Roose, Thomas
75.
Rossow, Thomas
76.
Scattolin, Thomas
77.
Schuler, Thomas V.
78.
Schuman, Thomas
79.
Servais, Thomas
80.
Sim, Thomas G.
81.
Suttner, Thomas J.
82.
Thomas, Guillaume F.
83.
Thomas, John
84.
Thomas, Peter
85.
Thomas-Crusells, J.
86.
Thomberg, Thomas
87.
Thurner, Thomas
88.
Uhrenholdt, Thomas
89.
Ulich, Thomas
90.
Unold, Thomas
91.
Vangkilde-Pedersen, Thomas
92.
Weber, Thomas
93.
Wenzel, Thomas
94.
Wiegand, Thomas
95.
Willett, Thomas D.
96.
Wingfield, Thomas
97.
Wortmann, Thomas
name of the person
10
1.
Lange, Friedrich Albert, 1828-1875
2.
Edison, Thomas Alva
3.
Fehniger, Thomas
4.
Hoffmann, Thomas
5.
Hollstein, Thomas
6.
Jefferson, Thomas, 1743-1826
7.
Kuhn, Thomas S., 1922-1996
8.
Palm, Thomas
9.
Seebeck, Thomas Johann, 1770-1831
10.
Vehmanen, Kiur-Thomas
CV
5
1.
Lange, Sven 1980
2.
Fehniger, Thomas Edward 1948-2015
3.
Floden, Thomas
4.
Hoffmann, Thomas 1979
5.
Hollstein, Thomas
subject term
1
1.
Tallinna Tehnikaülikool. Thomas Johann Seebecki elektroonikainstituut
keyword
1
1.
Thomas Jefferson
TTÜ department
1
1.
Thomas Johann Seebecki elektroonikainstituut
TTÜ subject term
1
1.
Thomas Johann Seebecki nimeline elektroonikainstituut
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