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Fast test pattern generation for sequential circuits using decision diagram representations (title)
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journal article
Fast test pattern generation for sequential circuits using decision diagram representations
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2000
/
3, p. 213-226 : ill
https://link.springer.com/article/10.1023/A:1008335130158
journal article
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keyword
7
1.
automated test pattern generation
2.
automatic test pattern generation
3.
high-level decision diagram
4.
structurally synthesized binary decision diagram (SSBDD)
5.
combinational and sequential circuits
6.
sequential circuits
7.
pattern Generation
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