Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
pattern Generation (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
2
Look more..
(1/121)
Export
export all inquiry results
(2)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Post-silicon validation of IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Jutman, Artur
;
Squillero, Giovanni
;
Tšertov, Anton
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791546
book article
2
book article
Simulation-based equivalence checking between IEEE 1687 ICL and RTL
Damljanovic, Aleksa
;
Jutman, Artur
;
Portolan, Michele
;
Tšertov, Anton
2019 IEEE International Test Conference (ITC)
2019
/
paper. 7.3, 8 p. : ill
https://doi.org/10.1109/ITC44170.2019.9000181
book article
Number of records 2, displaying
1 - 2
keyword
121
1.
automated test pattern generation
2.
automatic test pattern generation
3.
pattern Generation
4.
architecture pattern
5.
circulation pattern
6.
demand time pattern
7.
FP Growth (Frequent-Pattern Growth) algorithm
8.
Image Processing and Pattern Recognition
9.
interaction design pattern
10.
load pattern
11.
nocturnal nondipping pattern
12.
pattern
13.
pattern classification
14.
pattern enumeration
15.
pattern formation
16.
pattern language
17.
pattern matching
18.
pattern mining for event logs
19.
pattern mining from event logs
20.
pattern mining from log files
21.
pattern of life
22.
pattern recognition
23.
pattern search
24.
phase resolved partial discharge (PRPD) pattern
25.
radio frequency pattern matching
26.
ripple pattern formation
27.
Single far-field pattern
28.
test-pattern
29.
Activity-based demand generation
30.
adaptive test strategy generation
31.
automated code generation
32.
automatic code generation
33.
Automatic generation control
34.
automatic GUI model generation
35.
automatic test case generation
36.
automatic test program generation
37.
behaviour level test generation
38.
building and urban form generation
39.
business model generation
40.
code generation
41.
data set generation
42.
decentralized key generation
43.
disaster alert generation
44.
distributed electricity generation
45.
distributed generation
46.
Distributed Generation (DG)
47.
distributed generation systems
48.
distributed power generation
49.
distrubuted power generation
50.
droplet generation
51.
droplet generation rate control
52.
electric power generation
53.
electricity generation
54.
energy generation
55.
extreme penetration level of non synchronous generation
56.
feasible path generation
57.
fifth generation computer
58.
food waste generation
59.
fourth generation district heating
60.
frequent item generation
61.
functional test generation
62.
generation
63.
generation and transmission expansion planning
64.
Generation Costs
65.
generation of electric energy
66.
generation scheduling
67.
generation succession
68.
heat generation
69.
Hierarchical Multi-level Test Generation
70.
high-level test data generation
71.
highlevel test generation
72.
hydroelectric power generation
73.
hydrogen generation
74.
I–III generation
75.
implementation-independent test generation
76.
job generation
77.
knowledge generation
78.
multisine generation
79.
next generation 4D printing
80.
next generation sequencing
81.
Next-generation probiotics
82.
next-generation sequencing
83.
offline test generation
84.
oil-shale power generation
85.
photovoltaic (PV) generation
86.
photovoltaic generation dispatch
87.
power generation
88.
power generation dispatch
89.
power generation economics
90.
power generation planning
91.
provably correct test generation
92.
PV generation
93.
PV power generation
94.
Renewable energy generation
95.
renewable generation
96.
residual generation
97.
rule generation
98.
Second generation bioethanol
99.
second generation of tribology models
100.
second generation sequencing
101.
signal generation
102.
silver generation
103.
sixth-generation (6G)
104.
solar power generation
105.
space generation advisory council
106.
template based sql generation
107.
test generation
108.
test generation and fault diagnosis
109.
Test Group Generation for Detecting Multiple Faults
110.
test program generation
111.
trajectory generation
112.
waste generation
113.
wave generation
114.
white light generation
115.
wind energy generation
116.
wind generation
117.
wind power generation
118.
16S rRNA gene amplicon next-generation sequencing
119.
4GDH (4th generation district heating)
120.
4th generation district heating
121.
5th generation district heating
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT