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1
book article
Analysis and improvement of resilience for long short-term memory neural networks
Ahmadilivani, Mohammad Hasan
;
Raik, Jaan
;
Daneshtalab, Masoud
;
Kuusik, Alar
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2023
https://doi.org/10.1109/DFT59622.2023.10313559
book article
2
book article
Bidirectional solid-state DC circuit breaker for the protection of cesidential and Commercial DC buildings
Aditya, P.
;
Yagna, V.
;
Banoth, T.
;
Chub, Andrii
;
Banavath, Satish Naik
2023 IEEE 8th Southern Power Electronics Conference and 17th Brazilian Power Electronics Conference (SPEC/COBEP)
2023
/
6 p
https://doi.org/10.1109/SPEC56436.2023.10407460
book article
3
book article
Comparison of (N+1) redundancy and fault tolerance approaches in single-stage series-connected isolated MVAC to LVDC converters
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Blinov, Andrei
;
Bayhan, Sertac
;
Vinnikov, Dmitri
2023 International Conference on Clean Electrical Power (ICCEP)
2023
/
p. 469-474 : ill
https://doi.org/10.1109/ICCEP57914.2023.10247478
book article
4
book article
How to prove that a circuit is fault-free?
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey
2012
/
p. 427-430 : ill
https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free
book article
5
book article
On-chip sensors data collection and analysis for SoC health management
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
;
Devadze, Sergei
;
Tsertov, Anton
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2023
/
6 p
https://doi.org/10.1109/DFT59622.2023.10313562
book article
6
book article
Representing gate-level SET faults by multiple SEU faults on RT-level
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Sauer, Christian
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
2020
/
art. 19889351, 6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159715
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
7
book article
RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems
Jenihhin, Maksim
;
Raik, Jaan
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
art. 19690741 , 6 p
https://doi.org/10.23919/DATE48585.2020.9116558
book article
8
book article
Short-circuit fault detection and remedial in full-bridge rectifier of series resonant DC-DC converter based on inductor voltage signature
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Vinnikov, Dmitri
2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings
2020
/
6 p. : ill
https://doi.org/10.1109/RTUCON51174.2020.9316482
book article
Seotud publikatsioonid
1
Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
9
journal article
Tehissüsteemide veakindlusest : [TTÜ arvutitehnika instituudi teadustöödest]
Ubar, Raimund-Johannes
Horisont
2006
/
2, lk. 64-69 : ill
https://artiklid.elnet.ee/record=b2039558*est
journal article
10
journal article EST
/
journal article ENG
Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
Cherezova, Natalia
;
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
Microelectronics reliability
2023
/
art. 115010, 10 p. : ill
https://doi.org/10.1016/j.microrel.2023.115010
Journal metrics at Scopus
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Article at WOS
journal article EST
/
journal article ENG
11
journal article
Usaldusväärsus ja veakindlus infohankesüsteemides
Müürsepp, Ivo
A & A
2011
/
2, lk. 28-46 : ill
journal article
Number of records 11, displaying
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