Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications
statement of authorship
Natalia Cherezova, Konstantin Shibin, Maksim Jenihhin, Artur Jutman
source
publisher
journal volume number month
vol. 146
year of publication
pages
art. 115010, 10 p. : ill
ISSN
0026-2714
notes
Bibliogr.: 75 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
language
inglise
subject term
keyword
classifier
kvartiil
category (general)
category (sub)
TTÜ department
Cherezova, N., Shibin, K., Jenihhin, M., Jutman, A. Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications // Microelectronics reliability (2023) vol. 146, art. 115010, 10 p. : ill. https://doi.org/10.1016/j.microrel.2023.115010