Searching - TalTech Research Portal

display

sort

1

journal article

Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill

journal article

2

journal article EST / journal article ENG

An automated method for mining high-quality assertion setsHeidari Iman, Mohammad Reza; Raik, Jaan; Jenihhin, Maksim; Jervan, Gert; Ghasempouri, TaraMicroprocessors and microsystems2023 / art. 104773 https://doi.org/10.1016/j.micpro.2023.104773 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Seotud publikatsioonid 1

Enhancing assertion-based verification in hardware designs through data mining algorithms = Andmekaeve algoritmide kasutamine riistvarasüsteemide väidete-põhise verifitseerimise parendamiseks

3

journal article EST / journal article ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

4

journal article EST / journal article ENG

Design and verification of Cyber-Physical Systems using TrueTime, evolutionary optimization and UPPAALBalasubramaniyan, Sreram; Srinivasan, Seshadhri; Buonopane, Furio; Balasubramanian, Subathra; Vain, Jüri; Ramaswamy, SriniMicroprocessors and microsystems2016 / p. 37-48 : ill https://doi.org/10.1016/j.micpro.2015.12.006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

5

journal article EST / journal article ENG

Design of Cyber Bio-analytical Physical Systems : formal methods, architectures, and multi-system interaction strategiesAshraf, Kanwal; Le Moullec, Yannick; Pardy, Tamas; Rang, ToomasMicroprocessors and microsystems2023 / art. 104780, 14 p. : ill https://doi.org/10.1016/j.micpro.2023.104780 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Seotud publikatsioonid 1

Co-design of wireless networked control systems : model-based architecture and joint optimization = Juhtmevabade võrgustatud juhtimissüsteemide koosdisain : mudelipõhine arhitektuur ja ühisoptimeerimine

6

journal article

Embedded fault diagnosis in digital systems with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanMicroprocessors and microsystems2008 / 5/6, p. 279-287 : ill

journal article

7

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article

8

journal article

Guest editorialEllervee, Peeter; Nurmi, JariMicroprocessors and microsystems2013 / p. 430-431

journal article

9

journal article

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-JohannesMicroprocessors and microsystems2008 / 5/6, p. 254-262 : ill https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288

journal article

10

journal article EST / journal article ENG

Modeling and simulation of circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan; Viies, VladimirMicroprocessors and microsystems2017 / p. 56-61 : ill https://doi.org/10.1016/j.micpro.2016.09.006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

11

journal article

Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanMicroprocessors and microsystems2015 / p. 1130-1138 : ill http://dx.doi.org/10.1016/j.micpro.2015.05.003

journal article

12

journal article EST / journal article ENG

Understanding multidimensional verification : where functional meets non-functionalLai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, DanMicroprocessors and microsystems2019 / art. 102867, 13 p. : ill https://doi.org/10.1016/j.micpro.2019.102867 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Seotud publikatsioonid 2

Microprocessors and microsystems (source)

types of item

keyword 1