Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
microprocessors (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
6
Look more..
(1/1)
Export
export all inquiry results
(6)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
A new measure for calculating multiple fault coverage of microprocessor self-test
Oyeniran, Adeboye Stephen
;
Odozi, Uzochukwu Eddie
;
Ubar, Raimund-Johannes
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 75-78 : ill
http://www.ester.ee/record=b2150914*est
book article
2
journal article EST
/
journal article ENG
Hardware trojan insertion in finalized layouts : from methodology to a silicon demonstration
Perez, Tiago Diadami
;
Pagliarini, Samuel Nascimento
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2023
/
p. 2094-2107
https://doi.org/10.1109/TCAD.2022.3223846
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees
3
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
4
book article
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
book article
5
journal article
Logic IP for low-cost IC design in advanced CMOS nodes
Isgenc, Mehmet Meric
;
Martins, Mayler G.A.
;
Zackriya, V. Mohammed
;
Pagliarini, Samuel Nascimento
;
Pileggi, Larry
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2020
/
p. 585-595
https://doi.org//10.1109/TVLSI.2019.2942825
journal article
6
book article EST
/
book article ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Number of records 6, displaying
1 - 6
keyword
1
1.
microprocessors
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT