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Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs

author
statement of authorship
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik
source
publisher
journal volume number month
vol. 77
year of publication
pages
art. 103117, 12 p
url
ISSN
0141-9331
notes
Bibliogr.: 43 ref
scientific publication
teaduspublikatsioon
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs // Microprocessors and microsystems (2020) vol. 77, art. 103117, 12 p. https://doi.org/10.1016/j.micpro.2020.103117