print

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs

author
Jürimägi, Lembit
Ubar, Raimund-Johannes
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik
source
Microprocessors and microsystems
publisher
Elsevier
journal volume number month
vol. 77
year of publication
2020
pages
art. 103117, 12 p
url
https://doi.org/10.1016/j.micpro.2020.103117
subject term
digitaaltehnika
diagnostika (tehnika)
rikked
testimine
elektronlülitused
keyword
combinational circuits
signal probabilities
testability
fault redundancy
structurally synthesized BDDs
ISSN
0141-9331
notes
Bibliogr.: 43 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
Journal metrics at Scopus
Article at Scopus
WOS
Journal metrics at WOS
Article at WOS
category (general)
Computer science
category (sub)
Computer science. Computer networks and communications
Computer science. Hardware and architecture
Computer science. Software
Computer science. Artificial intelligence
kvartiil
Q2
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs // Microprocessors and microsystems (2020) vol. 77, art. 103117, 12 p. https://doi.org/10.1016/j.micpro.2020.103117