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51
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
52
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
53
book article
Modeling microprocessor faults on high-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
;
Jenihhin, Maksim
;
Istenberg, Martin
;
Wuttke, Heinz-Dietrich
DSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska
2008
/
p. C17-C22 : ill. [CD-ROM]
https://webhost.laas.fr/TSF/WDSN08/2ndWDSN08(LAAS)_files/Slides/WDSN08S-04-Ubar.pdf
book article
54
book article
Modular approach to training hardware design for modular teaching [Electronic resource]
Galkin, Ilja
;
Laugis, Juhan
EPE-PEMC 2006 : 12th International Power Electronics and Motion Control Conference : Portorož, Slovenia, August 30 - September 1, 2006 : proceedings
2006
/
p. 1715-1720 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4778652
book article
55
book article
MSP430 as an introductory training microcontroller
Galkin, Ilja
2nd International Symposium "Topical Problems of Education in the Field of Electrical and Power Engineering" : Kuressaare, Estonia, January 17-22, 2005
2005
/
p. 123-126
book article
56
journal article
Muutused protsessorite ja PC-de võitlustandril
Tammemäe, Kalle
A & A
1999
/
3, lk. 7-14: ill
https://artiklid.elnet.ee/record=b1001307*est
journal article
57
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
58
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
59
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
60
journal article
Orgaaniline mikroprotsessor
Toomsalu, Arvo
A & A
2011
/
lk. 18-21 : ill
journal article
61
book article EST
/
book article ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
62
book
Personaalarvutid mikroprotsessoril 80486. Sise- ja välisseadmete liidesed, matemaatikaprotsessorid, jõudlustestid
Toomsalu, Arvo
1992
https://www.ester.ee/record=b1064225*est
book
63
book article
PIC microcontroller learning system
Jalakas, Tanel
;
Möller, Taavi
;
Roasto, Indrek
3rd International Symposium "Topical Problems of Education in the Field of Electrical and Power Engineering" : Doctoral School of Energy and Geotechnology : Kuressaare, Estonia, January 16-21, 2006
2006
/
p. 99-101 : ill
book article
64
journal article
Pingviiniprotsessor
Tammemäe, Kalle
A & A
1999
/
6, lk. 8-11
https://artiklid.elnet.ee/record=b1002707*est
journal article
65
journal article
Post-RISC-arhitektuur
Toomsalu, Arvo
A & A
2001
/
2, lk. 8-14 ; 3, lk. 7-16
https://artiklid.elnet.ee/record=b1006602*est
journal article
66
book article EST
/
book article ENG
Preface
Hollstein, Thomas
;
Raik, Jaan
;
Kostin, Sergei
;
Tšertov, Anton
;
O’Connor, Ian
;
Reis, Ricardo
VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016 : Revised Selected Papers
2017
/
p. V-VI
https://link.springer.com/book/10.1007/978-3-319-67104-8
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
67
journal article
Protsessor mälus
Toomsalu, Arvo
A & A
2001
/
4, lk. 9-16
https://artiklid.elnet.ee/record=b1007646*est
journal article
68
journal article
RISC-mikroprotsessorid reaalajasüsteemides
Toomsalu, Arvo
Arvutustehnika ja Andmetöötlus
1994
/
10, lk. 2-5 ; 11, lk. 2-6
journal article
69
book
RISC-mikroprotsessorite arhitektuur
Toomsalu, Arvo
1995
https://www.ester.ee/record=b1069536*est
book
70
journal article
Runtime contention and bandwidth-aware adaptive routing selection strategies for networks-on-chip
Samman, Faizal
;
Hollstein, Thomas
;
Glesner, Manfred
IEEE transactions on parallel and distributed systems
2013
/
p. 1411-1421 : ill
journal article
71
dissertation
Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjal
Jasnetski, Artjom
2018
https://digi.lib.ttu.ee/i/?10629
https://www.ester.ee/record=b5151486*est
dissertation
72
journal article
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
https://artiklid.elnet.ee/record=b2665215*est
journal article
73
book article
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
74
book
Software-based self-test with decision diagrams for microprocessors
Ubar, Raimund-Johannes
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Oyeniran, Adeboye Stephen
2018
book
75
journal article
SPARC-V8- ja V9-arhitektuuriga mikroprotsessorid
Toomsalu, Arvo
Arvutustehnika ja Andmetöötlus
1995
/
7, lk. 14-23: ill
journal article
Number of records 121, displaying
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