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Tihhomirov, Valentin (author)
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1
book article
A scalable model based RTL framework zamiaCAD for static analysis
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Tihhomirov, Valentin
2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) : October 7-10, 2012 Santa Cruz, USA Dream Inn, Santa Cruz, USA : [proceedings]
2012
/
p. 171-176 : ill
book article
2
book article
Applications of the open source HW design framework zamiaCAD
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p
book article
3
book article
Assessment of diagnostic test for automated bug localization
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[6] p. : ill
book article
4
journal article
Automated design error localization in RTL designs
Jenihhin, Maksim
;
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Raik, Jaan
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Bartsch, Günter
;
Meza Escobar, Jorge Hernan
;
Wuttke, Heinz-Dietrich
IEEE design & test of computers
2014
/
p. 83-92 : ill
http://dx.doi.org/10.1109/MDAT.2013.2271420
journal article
5
book article
Diagnostic test generation for statistical bug localization using evolutionary computation
Gaudesi, Marco
;
Jenihhin, Maksim
;
Raik, Jaan
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Applications of Evolutionary Computation : 17th European Conference, EvoApplications 2014, Granada, Spain, April 23-25, 2014 : revised selected papers
2014
/
p. 425-436 : ill
book article
6
book article
Environment for fault simulation acceleration on FPGA
Ellervee, Peeter
;
Raik, Jaan
;
Tihhomirov, Valentin
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 217-220 : ill
book article
7
book article
Evaluating fault emulation on FPGA
Ellervee, Peeter
;
Raik, Jaan
;
Tihhomirov, Valentin
;
Tammemäe, Kalle
Field-Programmable Logic and Applications : 14th International Conference, FPL 2004 : Antwerp, Belgium, August 30-September 1, 2004 : proceedings
2004
/
p. 354-363 : ill
book article
8
book article
Fast fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 35-40
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0
book article
9
book article
Fault emulation on FPGA : a feasibility study
Ellervee, Peeter
;
Raik, Jaan
;
Tihhomirov, Valentin
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 92-95 : ill
https://www.researchgate.net/publication/246171898_Fault_Emulation_on_FPGA_A_Feasibility_Study
book article
10
book article
FPGA based fault emulation of synchronous sequential circuits
Ellervee, Peeter
;
Raik, Jaan
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 59-62
https://ieeexplore.ieee.org/abstract/document/1423822
book article
11
journal article EST
/
journal article ENG
Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
Jenihhin, Maksim
;
Squillero, Giovanni
;
Tihhomirov, Valentin
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 273-289 : ill
https://doi.org/10.1007/s10836-016-5589-x
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
12
book article
Improved fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 72-78 : ill
book article
13
book article
Localization of bugs in processor designs using zamiaCAD framework
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
13th International Workshop on Microprocessor Test and Verification (MTV 2012) Common Challenges and Solutions : Austin, USA, December 10–12, 2012
2012
/
p. 1-6
https://ieeexplore.ieee.org/document/6519733
book article
14
book article
PSL assertion checkers synthesis with ASM based HLS tool ABELITE
Jenihhin, Maksim
;
Baranov, Samary
;
Raik, Jaan
;
Tihhomirov, Valentin
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
[6 p.] : ill
https://ieeexplore.ieee.org/document/6261251
book article
15
book article
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
Palermo, N.
;
Tihhomirov, Valentin
;
Copetti, Thiago
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102405
book article
16
book article EST
/
book article ENG
Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programs
Pellerey, Francesco
;
Jenihhin, Maksim
;
Squillero, Giovanni
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan
2016
/
p. 304-309 : ill
https://doi.org/10.1109/ATS.2016.57
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
17
book article
zamiaCAD : understand, develop and debug hardware designs
Jenihhin, Maksim
;
Tihhomirov, Valentin
;
Saif Abrar, Syed
;
Raik, Jaan
;
Bartsch, Günter
DUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany
2014
/
p. 1-6
book article
18
book article
Using simulation statistics for bug localization in RTL designs
Tihhomirov, Valentin
;
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 107-110 : ill
book article
19
book article
VHDL design debug framework based on zamiaCAD
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France
2013
/
[1] p. : ill
book article
Number of records 19, displaying
1 - 19
author
16
1.
Tihhomirov, Valentin
2.
Berne, Valentin
3.
Bratkov, Valentin
4.
Jutman, Valentin
5.
Kamankin, Valentin
6.
Meng, Valentin
7.
Mihailov, Valentin
8.
Naidenko, Valentin
9.
Niebler, Valentin
10.
Pikkov, Valentin
11.
Preis, Valentin
12.
Rudenko, Valentin
13.
Tapper, Valentin
14.
Tomasov, Valentin S.
15.
Valentin, Jose
16.
Wehefritz, Valentin
CV
11
1.
Bogomolov, Valentin 1946
2.
Bratkov, Valentin 1981
3.
Judanov, Valentin 1943
4.
Jutman, Valentin 1938
5.
Meng, Valentin 1927-2002
6.
Müürsepp, Valentin 1906-1941
7.
Novožilov, Valentin 1939
8.
Nõmm, Valentin 1910-1993
9.
Nõmm, Valentin Adolf
10.
Preis, Valentin 1920
11.
Tapper, Valentin 1911-2004
name of the person
5
1.
Bratkov, Valentin
2.
Kordas, Valentin
3.
Meng, valentin
4.
Nõmm, Valentin
5.
Tapper, Valentin, 1911-2004
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