Otsing - TalTech teadusportaal

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93101

artikkel kogumikus

Test pattern generation at the behavioral level from VHDL circuit description containing several processesGramatova, Elena; Bezakova, Jana; Cibakova, TatianaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 145-148

artikkel kogumikus

93102

artikkel kogumikus

Test pattern generation for microprocessor systems on the alternative graph modelUbar, Raimund-JohannesProceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 19831985 / p. 403-410

artikkel kogumikus

93103

dissertatsioon

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

dissertatsioon

93104

artikkel kogumikus

Test results of practical value-centric business development methodologyRandmaa, Merili; Otto, Tauno; Howard, Thomas J.Proceedings of NordDesign 2014 Conference2014 / p. 642-651 : ill

artikkel kogumikus

93105

artikkel kogumikus

Test scenario generator learning for model-based testing of mobile robotsKanter, Gert; Liibert, Marti IngmarSystem assurances : modeling and management2022 / p. 67-84 https://doi.org/10.1016/B978-0-323-90240-3.00005-9

artikkel kogumikus

93106

artikkel ajakirjas EST / artikkel ajakirjas ENG

Test scenario specification language for model-based testingHalling, Evelin; Vain, Jüri; Boyarchuk, Artem; Illiashenko, OlegInternational Journal of Computing2019 / p. 408-421 : ill http://www.computingonline.net/computing/article/view/1611 https://doi.org/10.47839/ijc.18.4.1611 Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

93107

artikkel kogumikus

Test set minimization using bipartite graphsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 175-178: ill

artikkel kogumikus

93108

artikkel kogumikus

Test setup for measuring medium voltage power cable and joint temperature in high current tests using thermocouples [Online resource]Taklaja, Paul; Kiitam, Ivar; Hyvönen, Petri; Klüss, Joni34th Electrical Insulation Conference : Hotel Bonaventure, Montreal, Qc, Canada, 19-22 June 2016 : proceedings2016 / p. 480-483 : ill https://doi.org/10.1109/EIC.2016.7548642

artikkel kogumikus

93109

artikkel kogumikus

Test strategy for a 486 computer multichip moduleMagnhagen, BengtBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 339-340: ill

artikkel kogumikus

93110

artikkel kogumikus

Test synthesis from register-transfer level descriptionsRaik, Jaan; Paomets, PriiduBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 311-314: ill

artikkel kogumikus

93111

artikkel ajakirjas

Test synthesis with alternative graphsUbar, Raimund-JohannesIEEE design & test of computers1996 / Spring, p. 48-57: ill

artikkel ajakirjas

93112

artikkel ajakirjas

Test system for fault detection and diagnosis in microprocessor control devicesUbar, Raimund-Johannes; Lohuaru, Tõnu; Männisalu, Mati; Pukk, P.; Vanamölder, E.Tallinna Tehnikaülikooli Toimetised1990 / lk. 63-77: ill

artikkel ajakirjas

93113

artikkel kogumikus

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China2003 / p. 318-325 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel kogumikus

93114

artikkel ajakirjas

Test time minimization for hybrid BIST of core-based systemsJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, MaksimJournal of computer science and technology2006 / 6, p. 907-912 : ill https://link.springer.com/article/10.1007/s11390-006-0907-x

artikkel ajakirjas

93115

artikkel kogumikus

Test time minimization for hybrid BIST with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 112-116 : ill https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf

artikkel kogumikus

93116

artikkel ajalehes

TEST: Gümnaasiumi maateaduse olümpiaadi küsimused [Võrguväljaanne]postimees.ee2021 "TEST: Gümnaasiumi maateaduse olümpiaadi küsimused"

artikkel ajalehes

93117

artikkel ajalehes

TEST: Kui hästi tunned meditsiinitehnoloogiat? [Võrguväljaanne]postimees.ee2021 "TEST: Kui hästi tunned meditsiinitehnoloogiat?"

artikkel ajalehes

93118

artikkel ajalehes

TEST: Kui palju tead energeetikast? [Võrguväljaanne]postimees.ee2021 "TEST: Kui palju tead energeetikast?"

artikkel ajalehes

93119

artikkel kogumikus

Testability analysis for efficient register-transfer level test generation [Electronic resource]Nõmmeots, Tanel; Raik, Jaan; Ubar, Raimund-Johannes9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 20022002 / [4] p. [CD-ROM]

artikkel kogumikus

93120

artikkel kogumikus

Testability analysis of digital design verificationHahanov, V.; Kaminska, M.; Fomina, JelenaBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 171-174 : ill

artikkel kogumikus

93121

artikkel kogumikus

Testability calculation for digital circuits with decision diagramsUbar, Raimund-Johannes3rd IEEE Latin American Test Workshop : LATW'02, Montevideu, Uruguay, February 10-13, 2002 : digest of papers2002 / p. 137-143 : ill

artikkel kogumikus

93122

artikkel kogumikus

Testability guided hierarchical test generation with decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Nõmmeots, Tanel20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 265-271

artikkel kogumikus

93123

artikkel kogumikus

Testability-based parameter measurement of analog measuring circuits in the frequency domainLiu, Ji-Gou; Frühauf, UweBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 329-332: ill

artikkel kogumikus

93124

artikkel ajakirjas

Testaliin - uus püüniste peitsimisvahend ja selle tarvitamineTiitus, B.Eesti Kalandus1939 / lk. 133-135

artikkel ajakirjas

93125

artikkel kogumikus

Testentwicklung für Mikroprozessorsystem mit Hilfe der alternativen GraphenAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales wissenschaftliches Kolloquium : 24.-28.10.1988. H.1.1988 / S- 11-14 https://www.ester.ee/record=b2936968*est

artikkel kogumikus

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