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51
book article
SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 223-228 : ill
book article
52
book article
State of charge estimation for Li-ion batteries based on equivalent circuit diagrams and the application of a Kalman filter
Rahmoun, Ahmad
;
Biechl, Helmuth
;
Rosin, Argo
12th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Kuressaare, Estonia, June 11-16, 2012
2012
/
p. 125-128 : ill
book article
53
book article
Switched capacitor general immitance converter
Kängsep, Eiko
;
Kukk, Vello
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 2
1994
/
p. 483-486: ill
https://www.ester.ee/record=b2150914*est
book article
54
dissertation
Symbolic test generation for hierarchically modeled digital systems
Zaugarov, Viktor
1993
https://www.ester.ee/record=b2090336*est
dissertation
55
book article
Synthesis of hierarchically testable FSM networks
Kasirova, Lilia
;
Keevallik, Andres
;
Kruus, Margus
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 347-352: ill
book article
56
book article
TCAD with device-circuit simulators for advanced process development, correlations between model parameters and optimization
Bubennikov, Alexander N.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 2
1994
/
p. 517-522: ill
https://www.ester.ee/record=b2150914*est
book article
57
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
58
book article
Testing tools
Jutman, Artur
Handbook of testing electronic systems
2005
/
p. 361-365 : ill
book article
59
book article
Testing tools
Raik, Jaan
Handbook of testing electronic systems
2005
/
p. 373-378 : ill
book article
60
book article
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
book article
61
journal article
Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
Microprocessors and microsystems
2015
/
p. 1130-1138 : ill
http://dx.doi.org/10.1016/j.micpro.2015.05.003
journal article
62
dissertation
Ökonoomsete negatiivse diferentsiaaltakistusega astmete ja elementide disainimine ja optimeerimine
Taniloo, Rainer
2005
https://www.ester.ee/record=b2073482*est
dissertation
63
book article
Генерирование тестов для цифровых схем при помощи модели альтернативных графов
Ubar, Raimund-Johannes
Труды по электротехнике и автоматике : сборник статей. 14
1976
/
с. 75-81
https://www.ester.ee/record=b2190768*est
https://digikogu.taltech.ee/et/Item/aa35e320-87b1-405b-9cac-3b90c51867d1
book article
64
book article
Диалоговая система моделирования электронных схем "ПОИСК"
Laksberg, Edgar
;
Nelus, K.
;
Ess, Viktor
Методы и устройства регистрации, передачи, обработки и представления информации
1986
/
с. 63-68
book article
65
book article
Единый подход к синтезу тестов цифровых схем и систем
Ubar, Raimund-Johannes
Межреспубликанская школа-семинар по технической диагностике, 8-12 октября 1984 года : тезисы докладов
1984
/
с. 75-81 : илл
https://www.ester.ee/record=b1237891*est
book article
66
book
Импульсные устройства : лабораторная работа No 5 : триггеры на логических элементах
1988
https://www.ester.ee/record=b1224918*est
book
67
dissertation
Исследование алгоритмов преобразования и аппроксимации параметров линейных систем и цепей на ЭВМ : автореферат ... кандидата технических наук (05.13.01)
Rüstern, Ennu
1976
https://www.ester.ee/record=b1301697*est
dissertation
68
dissertation
Исследование алгоритмов преобразования и аппроксимации параметров линейных систем и цепей на ЭВМ : диссертация на соискание ученой степени кандидата технических наук
Rüstern, Ennu
1975
https://www.ester.ee/record=b4630872*est
dissertation
69
book article
О выборе варьируемых элементов при оптимизации электронных схем
Laksberg, Edgar
;
Ess, Viktor
Труды по радиотехнике. 3
1976
/
с. 3-8 : илл
https://www.ester.ee/record=b2190765*est
https://digikogu.taltech.ee/et/Item/051089c8-3240-47a7-84ae-2e65ba92e5fb
book article
70
book article
Об общей постановке задач тестовой диагностики цифровых схем
Ubar, Raimund-Johannes
Труды по электротехнике и автоматике : сборник статей. 14
1976
/
с. 69-73
https://www.ester.ee/record=b2190768*est
https://digikogu.taltech.ee/et/Item/aa35e320-87b1-405b-9cac-3b90c51867d1
book article
71
book article
Организация тестовых экспериментов цифровых систем на основе модели альтернативных графов
Lohuaru, Tõnu
Межреспубликанская школа-семинар по технической диагностике, 8-12 октября 1984 года : тезисы докладов
1984
/
с. 47-52
https://www.ester.ee/record=b1237891*est
book article
72
book
Применение алгебры Буля при проектировании схем автоматики : конспект лекций
Agur, Ustus
1974
https://www.ester.ee/record=b1292481*est
book
73
book
Руководство по применению пакета прикладных программ анализа и оптимизации электронных схем "ПОИСК"
1983
https://www.ester.ee/record=b1271968*est
book
74
book
Тестовая диагностика цифровых устройств : учебное пособие. II, Синтез и анализ тестов. Дешифрация диагностических экспериментов
Ubar, Raimund-Johannes
1981
https://www.ester.ee/record=b1326795*est
book
Number of records 74, displaying
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