Searching - TalTech Research Portal

display

sort

1

book article

Automated design and diagnosis of electronic system based on description language representationWawryn, Krzysztof; Drabarek, JozefBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 443-448 https://www.ester.ee/record=b2150914*est

book article

2

book article

Automatic circuit partitioning for FPGAsKrupnova, Helena; Abbara, A.; Brasen, D.; Saucier, GabrieleBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 389-392: ill

book article

3

book

Boole'i algebra kasutamine automaatikalülituste projekteerimisel : loengukonspektAgur, Ustus1972 https://www.ester.ee/record=b1327567*est

book

4

journal article EST / journal article ENG

Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanMicroprocessors and microsystems2020 / art. 103117, 12 p https://doi.org/10.1016/j.micpro.2020.103117 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

5

book article

Chaos in electronic circuitsLindberg, ErikBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 29-37: ill

book article

6

book article

Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill

book article

7

book article

Complex delay fault reasoning with sequential 7-valued algebraKõusaar, Jaak; Ubar, Raimund-Johannes; Aleksejev, Igor2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102403

book article

8

book

Computational aspects of nodal method for simulation of electronic circuitsLaksberg, Edgar1983

book

9

journal article

Computer-aided examination of the I²L current source and the behaviour of the I²L flip-flop used in static memory cellsRang, ToomasPeriodica polytechnica. Electrical engineering = Электротехника1981 / p. 159-165 : joon https://www.ester.ee/record=b1198855*est https://pp.bme.hu/ee/article/view/4776/3881

journal article

10

book article

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

book article

11

book article

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

book article

12

book article

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

book article

13

book article

Defects, faults and fault modelsGramatova, Elena; Fisherova, Maria; Ubar, Raimund-Johannes; Pleskacz, Witold A.Handbook of testing electronic systems2005 / p. 26-96 : ill

book article

14

journal article

Design error diagnosis in digital circuits with stuck-at fault modelJutman, Artur; Ubar, Raimund-JohannesMicroelectronics reliability2000 / 2, p. 307-320 : ill

journal article

15

book article

Diagnostics system for electronic circuitsMelentjev, Sergei11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 20122012 / p. 192-194 : ill

book article

16

book

Digitaalsüsteemide diagnostikaUbar, Raimund-Johannes2005 http://www.ester.ee/record=b2097071*est

book

17

book article

Efficient at-speed interconnect BIST and diagnosis frameworkJutman, ArturInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 257-258 : ill https://artiklid.elnet.ee/record=b1018804*est

book article

18

book article

Ein universeller Weg zur Automatisierung des Testentwurfs für digitale ObjecteUbar, Raimund-Johannes; Lohuaru, TõnuFehler in Automaten1989 / S. 16-30 : Ill

book article

19

book

Electronic circuits : examples for project based subject "Technologies of electronic products"Sillakivi, Peeter; Tamm, Uljas2003 https://www.ester.ee/record=b1828290*est

book

20

book

Elektronlülitused : näidisskeemid projektipõhilisele õppeainele "Elektrontoodete tehnoloogiad"2003 https://www.ester.ee/record=b1828299*est

book

21

book

European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedingsCantarella, JD2005 https://www.ester.ee/record=b2300865*est

book

22

book article

Evolutionary approach to test generation for functional BISTSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-Johannes; Raik, JaanInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 151-155 : ill https://artiklid.elnet.ee/record=b1018764*est

book article

23

journal article

Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanInternational journal of microelectronics and computer science2018 / p. 9−18 https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1 https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf

journal article

24

book article

Experimental performance validation of Z-source DC circuit breaker for high impedance faultsPogulaguntla, Aditya; Naik Banavath, Satish; Chub, Andrii; Vinnikov, Dmitri; Singh, Rajendra2024 IEEE Sixth International Conference on DC Microgrids (ICDCM)2024 / 5 p https://doi.org/10.1109/ICDCM60322.2024.10664702

book article

25

journal article EST / journal article ENG

Fast identification of true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, Jaan; Jürimägi, LembitMicroelectronics reliability2018 / p. 252-261 : ill https://doi.org/10.1016/j.microrel.2017.11.027 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

elektronlülitused (subject term)

types of item

subject term 1