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Velmre, Enn (author)

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26

book article

Efficiency estimation for a broadband 7 THz radiation source with GaAs/AlGaAs parabolic quantum wellsReeder, Reeno; Ikonic, Zoran; Harrison, Paul; Udal, Andres; Velmre, EnnThe proceedings of the Ninth International Conference on Intersubband Transitions in Quantum Wells : Ambleside, Cumbria, U.K., 9-14th September 20072007 / p. P67-2

book article
27

book article

Electrothermal simulation of power semiconductor devicesFreidin, Boris; Velmre, Enn; Udal, AndresProceedings of the 1991 International Workshop on VLSI Process and Device Modeling, 26-27 May, 1991, Oiso, Kanagava, Japan1991 / p. 28-29

book article
28

book article

Electro-thermal simulations and forward surge current failure prediction for SiC diodesVelmre, Enn; Udal, AndresProgram of 17th Nordic Semiconductor Meeting, Trondheim, Norwey, June 17-20, 19961996 / p. 28

book article
29

book article

Elektroonika desintegratsioonVelmre, EnnTallinna Tehnikaülikooli aastaraamat 20022003 / lk. 33-38

book article
30

book article

Failure prediction of power devices under reverse surge current conditionsFreidin, Boris; Velmre, Enn; Udal, AndresProc. of the 4th International Symposium on Power Semiconductor Devices May 1992 Waseda University1992 / p. 118-128: fig

book article
31

book article

40 years of Electronics Department at Tallinn Technical UniversityTamm, Uljas; Velmre, EnnBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 7-10

book article
32

journal article

GIGA - power semiconductor devices simulation softwareFreidin, Boris; Velmre, Enn; Udal, AndresThe Bug Exterminator (USA). Special issue, Santa Clara1990 / Dec., p. 1-16: fig

journal article
33

book article

High phonon-drag thermoelectric efficiency of SiC at low temperaturesVelmre, Enn; Udal, Andres; Grivickas, V.Final program of the 10th International Conference on SiC and Related Materials : ICSCRM'2003 : Lyon, France, Oct. 5-10, 20032003 / p. ThP4-13 https://www.researchgate.net/publication/240834700_High_Phonon-Drag_Thermoelectric_Efficiency_of_SiC_at_Low_Temperatures

book article
34

journal article

Impact of phonon drag effect on seebeck coefficient in p-6H-SiC : experiment and simulationBikbajevas, V.; Velmre, Enn; Udal, AndresMaterial science forum2003 / p. 407-410 https://www.scientific.net/MSF.433-436.407

journal article
35

book article

Impact of phonon-drag effect on seebeck coefficient in SiC : experiment and simulationBikbajevas, V.; Grivickas, V.; Stölzer, M.; Velmre, Enn; Udal, AndresAbstracts of the Lithuanian National Physics Conference : LNPK-34 : Vilnius, 20032003 / p. 219

book article
36

book article

Influence of excitonic scattering on charge carrier ambipolar diffusion in siliconUdal, Andres; Velmre, EnnESSDERC'97 : proceedings of the 27th European Solid-State Device Research Conference, Stuttgart, Germany, 22-24 September 19971997 / p. 212-215: ill

book article
37

book article

Infotehnoloogia teaduskondGordon, Boris; Velmre, Enn; Einer, Lauri; Tamm, Uljas; Meister, Ants; Korsen, Viljo; Märtens, Olev; Parve, Toomas; Ubar, Raimund-Johannes; Min, MartLeiutajaid ja leiutisi Tallinna Tehnikaülikoolis 1922-20072008 / lk. 34-47 : ill https://www.ester.ee/record=b2412718*est

book article
38

book article

Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodesVelmre, Enn; Udal, AndresSilicon carbide and related materials 20062007 / p. 375-378 https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes

book article
39

book article

Investigation of silicon carbide diode structures via numerical simulations including anisotropic effectsVelmre, Enn; Udal, Andres; Masszi, F.; Nordlander, E.Simulation of semiconductor devices and processes. Vol. 61995 / p. 340-343: ill

book article
40

newspaper article

Jaapani professor esines Tallinna Tehnikaülikoolis : [Tohoku Ülikooli biomeditsiinielektroonika labori juhataja Nozomu Hoshimiya]Min, Mart; Velmre, EnnMente et Manu2001 / lk. 3 : portr https://www.ester.ee/record=b1242496*est

newspaper article
41

book article

Jõupooljuhtseadiste numbrilise modelleerimise alased tööd TPI-sVelmre, EnnKõrgema tehnilise hariduse ja tehnilise mõtte areng Eestis1988 / lk. 128-143

book article
42

dissertation

Jõupooljuhtseadiste numbriliste mudelite väljatöötamine ja rakendamine : ainevaldkond : elektrotehnika : magistritööUdal, Andres1992 http://www.ester.ee/record=b2630327*est

dissertation
43

book article

Kui vana on elektroonika?Velmre, EnnElektroonika 2004 : XI rahvusvahelise telekommunikatsioonipäeva materjalid2004 / lk. 53-56

book article
44

book article

Kui vana on elektroonika? : ettekanne rahvusvahelise telekommunikatsioonipäeva konverentsil "Elektroonika 2004" 14. mail 2004 TTÜsVelmre, EnnTallinna Tehnikaülikooli aastaraamat 20042005 / lk. 291-296

book article
45

newspaper article

Kuulsa füüsiku mälestusmärk TTÜ linnakus : [Thomas Johann Seebecki mälestusmärgi avamine 24. mail]Velmre, EnnMente et Manu2013 / lk. 18 : fot https://www.ester.ee/record=b1242496*est

newspaper article
46

book

Kõrgema tehnilise hariduse ja tehnilise mõtte areng EestisKulbach, Valdek; Hinrikus, Hiie; Järvik, Jaan; Kanasaar, Eduard; Kilk, Aleksander; Metusala, Tiit; Mägi, Vahur; Tamm, Uljas; Tapupere, Olev; Tiismus, Hugo; Ubar, Raimund-Johannes; Velmre, Enn1988 https://www.ester.ee/record=b1243393*est

book
47

journal article

Laterally pumped GaAs/AlGaAs quantum wells as sources of broadband tetrahertz radiationReeder, Reeno; Ikonic, Zoran; Harrison, Paul; Udal, Andres; Velmre, EnnJournal of applied physics2007 / 7, [6] p. : ill https://pubs.aip.org/aip/jap/article/102/7/073715/987937/Laterally-pumped-GaAs-AlGaAs-quantum-wells-as

journal article
48

book article

Measurement of charge carrier lifetime temperature-dependence in 4H-SiC power diodesUdal, Andres; Velmre, EnnProceedings of the International Conference on Silicon Carbide and Related Materials - 1999 (ICSCRM'99) : Research Triangle Park, North-Carolina, USA, Oct. 10-15, 1999. Vol. 12000 / p. 781-784 https://www.scientific.net/MSF.338-342.781

book article
49

book article

Measurements of charge carrier lifetime temperature dependence in 4H-SiC power diodesVelmre, Enn; Udal, AndresAbstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA1999 / paper no 394, 2 p

book article
50

dissertation

Modeling and simulation of bipolar semiconductor devices : authors's main publicationsVelmre, Enn1996 http://www.ester.ee/record=b2079366*est

dissertation

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