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2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (source)

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APPRAISER : DNN fault resilience analysis employing approximation errorsTaheri, Mahdi; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)2023 / p. 124−127 : ill https://ddecs2023.taltech.ee/ https://doi.org//10.1109/DDECS57882.2023.10139468

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