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book article EST / book article ENG

Condition monitoring and fault detection for electrical machines using IOTRaja, Hadi Ashraf; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, AntsProceedings of the Future Technologies Conference (FTC) 2022. Volume 22023 / p. 162-173 https://doi.org/10.1007/978-3-031-18458-1_12 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

Seotud publikatsioonid 1

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

52

book article

Condition monitoring of electrical machinesVaimann, Toomas; Kallaste, Ants11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 20122012 / p. 209-212 : ill

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53

book article

Condition monitoring of electrical machines and its relation to industrial internetBelahcen, Anouar; Gyftakis, Konstantinos N.; Martinez, Javier; Climente-Alarcon, Vicente; Vaimann, Toomas2015 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) : proceedings : Castello del Valentino, Torino, Italy, 26-27 March, 20152015 / p. 233-241 : ill http://dx.doi.org/10.1109/WEMDCD.2015.7194535

book article

54

book article

Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]Jürimägi, Lembit; Ubar, Raimund-JohannesBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p. : ill https://doi.org/10.1109/BEC.2018.8600967

book article

55

journal article

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill http://dx.doi.org/10.1007/s10513-005-0054-9

journal article

56

dissertation

Cost-effective concurrent hardware checkers for network on chip based system on chip = Kulutõhusad süsteemiga paralleelsed rikkemonitorid kiipvõrkudel põhinevatele kiipsüsteemideleHariharan, Ranganathan2019 https://digi.lib.ttu.ee/i/?12854 https://www.ester.ee/record=b5243161*est

dissertation

57

book article

Cost-efficient real-time condition monitoring and fault diagnostics system for BLDC motor using IoT and Machine learningRaja, Hadi Ashraf; Raval, Hardik; Vaimann, Toomas; Kallaste, Ants; Rassõlkin, Anton; Belahcen, AnouarDiagnostika '22 : 2022 International Conference on Diagnostics in Electrical Engineering : conference proceedings2022 / 4 p. https://doi.org/10.1109/Diagnostika55131.2022.9905102

book article

Seotud publikatsioonid 1

IoT based tools and methods for electrical machine diagnostics = Asjade interneti põhised tööriistad ja meetodid elektrimasinate diagnostikaks

58

book article

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

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59

book article

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

book article

60

dissertation

Cross-layer dependability management in network on chip based system on chip = Kiipvõrkudel põhinevate süsteemide kihtideülene usaldatavuse haldusAzad, Siavoosh Payandeh2018 https://digi.lib.ttu.ee/i/?9948 https://www.ester.ee/record=b5056143*est

dissertation

61

book article

Data-driven cross-layer fault management architecture for sensor networksVihman, Lauri; Kruusmaa, Maarja; Raik, Jaan16th European Dependable Computing Conference : EDCC 2020 : Virtual Conference, Munich, Germany, 7-10 September 2020 : proceedings2020 / art. 20094188, p. 33-40 https://doi.org/10.1109/EDCC51268.2020.00015

book article

Seotud publikatsioonid 1

Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuur

62

dissertation

Data-driven fault-resilient cross-layer sensor network architecture = Andmepõhine tõrkekindel kihtideülene sensorvõrgu arhitektuurVihman, Lauri2024 https://www.ester.ee/record=b5657135*est https://digikogu.taltech.ee/et/Item/00a93258-dc0f-4a4d-822f-099fff757224 https://doi.org/10.23658/taltech.7/2024

dissertation

Seotud publikatsioonid 5

63

book article

Deductive fault simulation on structurally synthesized BDDsAarna, Margit; Ubar, Raimund-Johannes; Raik, JaanBEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 / p. 11 : ill

book article

64

journal article

DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN acceleratorsTaheri, Mahdi; Riazati, Mohamad; Ahmadilivani, Mohammad Hasan; Jenihhin, Maksim; Daneshtalab, Masoud; Raik, Jaan; Sjödin, Mikael; Lisper, BjörnarXiv.org2023 / 8 p. : ill https://doi.org/10.48550/arXiv.2303.0822

journal article

65

book article

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

book article

66

journal article

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

journal article

67

book article

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

book article

68

book article

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

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69

book article

Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

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70

book

Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne]Palu, Ivo; Keel, Matti; Tammoja, Heiki2016 https://www.elektrilevi.ee/-/doc/6305157/ettevottest/defektide_rikete_aruanne.pdf

book

71

book article

DefSim - the defective ICPleskacz, Witold A.; Jutman, Artur; Ubar, Raimund-Johannes; Devadze, SergeiDATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 20072007 / p. s96 (2 p.)

book article

72

dissertation

Dependability improvements of NoC-based systems = Töökindluse parandamine kiipvõrkudel põhinevates süsteemidesNiazmand, Behrad2018 https://digi.lib.ttu.ee/i/?9879 https://www.ester.ee/record=b4907650*est

dissertation

73

book article EST / book article ENG

Dependence of the carrier removal rate in 4H-SIC PN structures on irradiation temperatureLebedev, Alexander A.; Davydovskaya, Klavdya S.; Kozlovski, Vitali V.; Korolkov, Oleg; Sleptsuk, Natalja; Toompuu, JanaSilicon Carbide and Related Materials 2018 : 12th European Conference on Silicon Carbide and Related Materials (ECSCRM 2018) : Selected, peer reviewed papers from the European Conference on Silicon Carbide and Related Materials (ECSCRM 2018), September 2-6, 2018,Birmingham, UK2019 / p. 730-733 https://doi.org/10.4028/www.scientific.net/MSF.963.730 Conference proceeding at Scopus Article at Scopus

book article EST / book article ENG

74

journal article

Design error diagnosis in digital circuits with stuck-at fault modelJutman, Artur; Ubar, Raimund-JohannesMicroelectronics reliability2000 / 2, p. 307-320 : ill

journal article

75

book article

Design error diagnosis in scan-path designsUbar, Raimund-Johannes2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers2001 / p. 162-168 : ill

book article

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