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testimine (subject term)
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376
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 133-136 : ill
book article
377
book article
Optimization of the store-and-generate based built-in self-test
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Aleksejev, Igor
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 199-202 : ill
book article
378
journal article EST
/
journal article ENG
Out-of-step protection based on discrete angle derivatives
Tealane, Marko
;
Kilter, Jako
;
Bagleybter, Oleg
;
Heimisson, Birkir
;
Popov, Marjan
IEEE Access
2022
/
p. 78290-78305
https://doi.org/10.1109/ACCESS.2022.3193390
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Future power system out-of-step protection concept utilizing synchronized phasor measurements = Tuleviku elektrisüsteemi faasimõõtmistel põhinev sünkronismikaotuskaitse kontseptsioon
379
journal article
Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systems
Ubar, Raimund-Johannes
Facta Universitatis [Niš]. Series electronics and energetics
2011
/
p. 303-324 : ill
http://dx.doi.org/10.2298/FUEE1103303U
journal article
380
book article
Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systems
Ubar, Raimund-Johannes
Proceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland
2011
/
p. 1-10 : ill
https://scindeks-clanci.ceon.rs/data/pdf/0353-3670/2011/0353-36701103303U.pdf
book article
381
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 2004
2004
/
p. 253-258 : ill
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
382
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 2004
2004
/
p. 173-176
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
383
book article
Parallel critical path tracing fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
Proceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 2018
2018
/
p. 305-310 : ill
https://doi.org/10.23919/MIXDES.2018.8436880
book article
384
book article
Parallel exact critical path tracing fault simulation with reduced memory requirements
Devadze, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009
2009
/
p. 155-160 : ill
https://ieeexplore.ieee.org/document/4938046
book article
385
book article EST
/
book article ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
386
book article
Performance estimation of embedded applications on microcontrollers
Ruberg, Priit
;
Lass, Keijo
;
Liiv, Elvar
;
Ellervee, Peeter
2017 IEEE Nordic Circuits and Systems Conference (NORCAS 2017): NORCHIP and International Symposium of System-on-Chip (SoC 2017) : Linkoping, Sweden, 23-25 October, 2017
2017
/
p. 170-175 : ill
http://dx.doi.org/10.1109/NORCHIP.2017.8124964
book article
387
book article
Performance testing of frost damage model by hygrothermal simulation
Ilomets, Simo
;
Kalamees, Targo
;
Raado, Lembi-Merike
Proceedings of the 5th International Building Physics Conference (IBPC) : Kyoto, Japan, May 28-31, 2012
2012
/
p. 73-80 : ill
book article
388
journal article
Pilvtestimisest
Leis, Paul
A & A
2010
/
3, lk. 3-4 : ill
https://artiklid.elnet.ee/record=b2183722*est
journal article
389
book article
Post-silicon validation of IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Jutman, Artur
;
Squillero, Giovanni
;
Tšertov, Anton
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791546
book article
390
book article
Precision force and move measurement systems in tribotechnical testing of journal bearings
Tamre, Mart
Sympozium naukowe : Mechatronica '92, Warsawa, 1992
1992
book article
391
newspaper article
Prillid eelmisest sajandist viska prügikasti : [TTÜ füüsikalaboris testiti päikeseprille]
Heinsoo, Enn
Äripäev
2006
/
7. juuli, Puhkepäev, lk. 30-31
https://www.aripaev.ee/uudised/2006/07/06/prillid-eelmisest-sajandist-viska-prugikasti
newspaper article
392
journal article EST
/
journal article ENG
Procedure for implementing new materials to the component additive method
Mäger, Katrin Nele
;
Just, Alar
;
Schmid, Joachim
;
Werther, Norman
;
Klippel, Michael
;
Brandon, Daniel
;
Frangi, Andrea
Fire safety journal
2019
/
p. 149-160 : ill
https://doi.org/10.1016/j.firesaf.2017.09.006
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
393
book article
Product platform modularization for test adapters
Sarkans, Martinš
;
Roosimölder, Lembit
OST-03 Symposium on Machine Design
2003
/
p. 100-106
book article
394
book article
Production quality related propagating faults of induction machines
Kudelina, Karolina
;
Asad, Bilal
;
Vaimann, Toomas
;
Rassõlkin, Anton
;
Kallaste, Ants
2020 XI International Conference on Electrical Power Drive Systems (ICEPDS), Saint-Petersburg, Russia, October 4-7, 2020
2020
/
p. 311-315 : ill
https://doi.org/10.1109/ICEPDS47235.2020.9249355
book article
Seotud publikatsioonid
1
Artificial intelligence driven approaches for fault prognostics of electrical machines using vibration spectrum analysis = Tehisintellektil põhinevad lähenemisviisid elektrimasinate rikete prognoosimiseks vibratsioonispektri analüüsi abil
395
book article
Proficiency testing in the area of measuring instruments belonging to verification
Kulderknup, Edi
;
Laaneots, Rein
Proc. 12th International Metrology Congress : Lyon, France
2005
/
[6] p
book article
396
book article
Provably correct test development for timed systems
Vain, Jüri
;
Anier, Aivo
;
Halling, Evelin
Databases and information systems VIII : selected papers from the Eleventh International Baltic Conference, DB&IS 2014
2014
/
p. 289-302 : ill
book article
397
book article
Provably correct test generation for online testing of timed systems
Vain, Jüri
;
Anier, Aivo
;
Halling, Evelin
Databases and Information Systems : proceedings of the 11th International Baltic Conference, Baltic DB&IS 2014 : Tallinn, Estonia, 8-11 June, 2014
2014
/
p. 337-348 : ill
book article
398
book article
Pseudojuhuslikud bitijadad ja nende juhuslikkuse testimine
Lossmann, Eerik
;
Meister, Ants
Ringhääling 2003 : X rahvusvahelise telekommunikatsioonipäeva materjalid
2003
/
lk. 54-59 : ill
book article
399
book article
Quality assuarance system of metals testing laboratory
Päärsoo, Riho
;
Veinthal, Renno
Proceedings of the 2nd International Conference, 27-29th April 2000, Tallinn, Estonia / DAAAM International Vienna, DAAAM National Estonia
2000
/
p. 313-315
book article
400
book article
Quality assurance in mechanical testing laboratory by participating in proficiency test
Päärsoo, Riho
;
Veinthal, Renno
;
Peetsalu, Priidu
;
Saarna, Mart
Proceedings of the 3rd International Conference Industrial Engineering - New Challenges to SME : 25-27 April 2002, Tallinn, Estonia
2002
/
p. 242-244 : ill
book article
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