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testimine (subject term)
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426
book article
Sequential circuits BIST synthesis from signal specifications
Raik, Jaan
;
Jenihhin, Maksim
;
Adelbert, Rain
Proceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 2005
2005
/
p. 196-199 : ill
https://ieeexplore.ieee.org/document/1597023
book article
427
book article
Sequential circuits BIST with status bit control
Raik, Jaan
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
2004
/
p. 507-510 : ill
https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf
book article
428
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
429
book article
Shift register based TPG for at-speed interconnect BIST
Jutman, Artur
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 751-754 : ill
https://ieeexplore.ieee.org/document/1314941?signout=success
book article
430
book article
Simulation and automated test development system for digital devices
Birger, Alexander
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 293-295
book article
431
journal article EST
/
journal article ENG
Single-stage buck–boost inverters: a state-of-the-art survey
Azizi, Mohammadreza
;
Husev, Oleksandr
;
Vinnikov, Dmitri
Energies
2022
/
art. 1622
https://doi.org/10.3390/en15051622
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
432
journal article
Sisseehitatud isetestimine digitaalsüsteemides
Kruus, Helena
A & A
2011
/
lk. 32-37 : ill
https://artiklid.elnet.ee/record=b2472216*est
journal article
433
book article
Smooth coordination and management of impact of EstLink 2 transmission testing on electricity markets, power system operations and system technical performance
Rauhala, T.
;
Laasonen, M.
;
Kilter, Jako
CIGRE Session 2016 : 21-26 August 2016, Paris, France
2016
/
p. 1-11
book article
434
book article
SoC and board modeling for processor-centric board testing
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings
2011
/
p. 575-582 : ill
https://ieeexplore.ieee.org/document/6037463
book article
435
book article
Soft-sensor approach in characterization of VRLA batteries
Tenno, Ander
;
Tenno, Robert
;
Suntio, Teuvo
Proc. INTELEC 2001
2001
/
p. 554-562
https://ieeexplore.ieee.org/document/988617/similar#similar
book article
436
book article
Software environment for synthesis of testable FSM through decomposition
Devadze, Sergei
;
Sudnitsõn, Aleksander
2008 26th International Conference on Microelectronics (MIEL 2008) : proceedings
2008
/
p. 433-436
https://ieeexplore.ieee.org/document/4559314
book article
437
dissertation
Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjal
Jasnetski, Artjom
2018
https://digi.lib.ttu.ee/i/?10629
https://www.ester.ee/record=b5151486*est
dissertation
438
book article
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
439
journal article
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
https://artiklid.elnet.ee/record=b2665215*est
journal article
440
book
Software-based self-test with decision diagrams for microprocessors
Ubar, Raimund-Johannes
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Oyeniran, Adeboye Stephen
2018
book
441
newspaper article
Solaride lõpetas testsõidu maastikupõlengu tõttu
Hansar, Helina
postimees.ee
2023
Solaride lõpetas testsõidu maastikupõlengu tõttu
newspaper article
442
book article
Some aspects of testing speaking skills in UK
Putrova, M.
;
Gridneva, I.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 74-76
book article
443
book article EST
/
book article ENG
Special session: approximation and fault resiliency of DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Barbareschi, Mario
;
Barone, Salvatore
;
Bosio, Alberto
;
Daneshtalab, Masoud
;
Torca, Salvatore Della
;
Gavarini, Gabriele
;
Jenihhin, Maksim
;
Raik, Jaan
;
Taheri, Mahdi
Proceedings 2023 IEEE 41st VLSI Test Symposium (VTS)
2023
/
10 p. : ill
https://doi.org/10.1109/VTS56346.2023.10140043
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
444
book article
Statistical strength of brittle materials : test methods and weibull modulus
Preis, Irina
Proceedings of the 3rd International Conference Industrial Engineering - New Challenges to SME : 25-27 April 2002, Tallinn, Estonia
2002
/
p. 205-208 : ill
book article
445
book article
Step-wise approximated multi-cycle sine wave for dynamic tests of AD converters
Land, Raul
XVI IMEKO World Congress : IMEKO2000 : proceedings of the 5th Workshop on ADC Modelling and Testing (EWADC'2000) : Vienna, Austria, Sept. 25-28, 2000
2000
/
p. 217-220
book article
446
book article
Structural fault collapsing by superposition of BDDs for test generation in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
2010
/
p. 250-257 : ill
https://ieeexplore.ieee.org/document/5450451
book article
447
newspaper article
Studioosus testis liiklust : [marsruudil TTÜ peahoone - Viru keskus]
Nassar, Bia
;
Käger, Maarja
Studioosus
2008
/
märts, lk. 10
newspaper article
448
book article
Study of effects of modulated microwaves by method of face masking
Rodina, Anastasia
;
Lass, Jaanus
;
Bachmann, T.
;
Hinrikus, Hiie
Proceedings of the 25th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Vol. 25, A New Beginning for Human Health : volume 4 of 4 : 17-21 September 2003, Cancun, Mexico
2003
/
p. 3249-3252
https://ieeexplore.ieee.org/document/1280836
book article
449
book article
Subsurface of Cr3C2-Ni cermets modified by wear [Electronic resource]
Antonov, Maksim
;
Hussainova, Irina
Proceedings of the 10th International Conference of the European Ceramic Society
2008
/
? p. [CD-ROM]
https://www.academia.edu/24587100/Subsurface_of_Cr_3_C_2_Ni_Cermets_Modified_by_Wear
book article
450
book article
A suite of IEEE 1687 benchmark networks
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
2016 IEEE International Test Conference (ITC) : proceedings
2016
/
art. 6.1, p. 1-10 : ill
https://doi.org/10.1109/TEST.2016.7805840
book article
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