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testimine (subject term)
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701
journal article EST
/
journal article ENG
Using STLs for effective in-field test of GPUs
Rodriguez Condia, Josie E.
;
Da Silva, Felipe Augusto
;
Bagbaba, Ahmet Cagrl
;
Guerrero-Balaguera, Juan-David
;
Hamdioui, Said
;
Sauer, Christian
;
Reorda, Matteo Sonza
IEEE Design and Test
2023
/
p. 109-117
https://doi.org/10.1109/MDAT.2022.3188573
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
702
book article
Using Tabu Search for optimization of memory-constrained hybrid BIST
Kruus, Helena
;
Jervan, Gert
;
Ubar, Raimund-Johannes
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 155-158 : ill
book article
703
book article
Using Tabu Search for optimization of memory-constrained hybrid BIST
Kruus, Helena
;
Jervan, Gert
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 85-88 : ill
book article
704
book article
Using Tabu search method for optimizing the cost of hybrid BIST
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Peng, Z.
XVI Conference on Design of Circuits and Integrated Systems : Porto, Portugal, 2001
2001
/
p. 445-450
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=e97bb394ff71aa0affcc5fb372404bbc246888a8
book article
705
book article
Using test pattern generation tool decider in hardware verification
Viilukas, Taavi
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 166-169 : ill
book article
706
book
Uued viisid bituumensideainete kvaliteediomaduste määramiseks ja võimalused nende rakendamiseks, pidades silmas konkreetsele objektile vastavaid kriteeriume sideaine eeldatavast elueast ja kasutuskohast lähtuvalt : teadus- ja arendustöö lõpparuanne [Võrguteavik]
Aavik, Andrus
;
Kulp, Maria
;
Sillamäe, Sven
;
Lill, Kristjan
;
Hesp, Simon A. M.
;
Teymourpour, Ponya
;
Bahia, Hussain
2015
https://www.mnt.ee/sites/default/files/survey/bituumeniuuring_2015.pdf
book
707
newspaper article
Uus projekt tõstab tarkvara kvaliteeti
Lepmets, Marion
Äripäev
2006
/
23. veebr., lk. 17
https://www.aripaev.ee/uudised/2006/02/22/uus-projekt-tostab-tarkvara-kvaliteeti
newspaper article
708
book article
Wafer-level die re-test success prediction using machine learning
Selg, Hardi
;
Jenihhin, Maksim
;
Ellervee, Peeter
21st IEEE Latin-American Test Symposium (LATS) 2020 : proceedings
2020
/
5 p
https://doi.org/10.1109/LATS49555.2020.9093672
book article
709
journal article
Validation, verification and testing of object-oriented programs
Tepandi, Jaak
;
Trausan-Matu, S.
Research report Institute for Computers and Informatics
1989
/
p. 1-22
journal article
710
journal article
Validation, verification and testing of object-oriented programs
Tepandi, Jaak
;
Trausan-Matu, S.
Studies and researches in computers and informatics
1990
/
1, p. 113-128
journal article
711
book article
Variability of high voltage circuit breaker performance parameters for condition monitoring
Asefi, Sajjad
;
Kiitam, Ivar
;
Manninen, Henri
;
Kilter, Jako
;
Tealane, Marko
;
Landsberg, Mart
International Conference on Condition Monitoring, Diagnosis and Maintenance 2023 - CMDM 2023 (7th edition), Bucharest, Romania, October 31th - November 2nd, 2023 : proceedings
2023
/
p. 1-10
book article
712
book
Water hammer and column separation due to accidential simultaneous closure of control valves in a large scale two-phase flow experimental test rig
Bergant, Anton
;
Westende, Jos M.C.van't
;
Koppel, Tiit
;
Gale, Janez
;
Hou, Qingzhi
;
Pandula, Zoltan
;
Tijsseling, Arris S.
2010
https://www.researchgate.net/publication/280624441_Water_hammer_and_column_separation_due_to_accidental_simultaneous_closure_of_control_valves_in_a_large-scale_two-phase_flow_experimental_test_rig
book
713
book article
Water hammer and column separation due to accidential simultaneous closure of control valves in a large scale two-phase flow experimental test rig
Bergant, Anton
;
Westende, Jos M.C.van't
;
Koppel, Tiit
;
Gale, Janez
;
Hou, Qingzhi
;
Pandula, Zoltan
;
Tijsseling, Arris S.
Proceedings of the ASME 2010 Pressure Vessels & Piping Division/K-PVP Conference : PVP2010 : July 18-22, 2010, Bellevue, Washington, USA
2010
/
[10] p.: ill
https://www.researchgate.net/publication/280624441_Water_hammer_and_column_separation_due_to_accidental_simultaneous_closure_of_control_valves_in_a_large-scale_two-phase_flow_experimental_test_rig
book article
714
book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
715
book article
Web based tools for synthesis and testing of digital devices
Devadze, Sergei
;
Jutman, Artur
;
Kruus, Margus
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
Proceedings of the International Conference on Computer Systems and Technologies (e-Learning) : CompSysTech'2002, Sofia, Bulgaria, 20-21 June
2002
/
p. 1.9-1 - 1.9-6 : ill
https://www.researchgate.net/publication/250738271_Web_Based_Tools_for_Synthesis_and_Testing_of_Digital_Devices
book article
716
book article
Web services testing in e-learning environments
Õunapuu, Enn
;
Tepandi, Jaak
Second International Conference on Multimedia and Information & Communication Technologies in Education (m-ICTE 2003) : Badajoz, Spain, 2003
2003
/
p. 1170-1177
book article
717
book article
Web-based environment for digital electronics test tools
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Schneider, Andre
Virtual Enterprises and collaborative networks : IFIP 18th World Computer Congress [and] TC5/WG5.5 - 5th Working Conference on Virtual Enterprises : 22-27 August 2004, Toulouse, France
2004
/
p. 435-442 : ill
https://link.springer.com/chapter/10.1007/1-4020-8139-1_46
book article
718
book article
Web-based framework for parallel distributed test [Electronic resource]
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008
2008
/
p. 271-274 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4538800
book article
719
newspaper article
WebTT - digitaalskeemide testimine ja diagnostikaalaste õppelaborite e-keskkond : [TTÜ arvutitehnika instituut esitles e-Ülikooli konverentsil kolme õppetöös kasutatavat süsteemi]
Robal, Tarmo
;
Orasson, Elmet
Mente et Manu
2005
/
5. mai, lk. 5 : fot
https://www.ester.ee/record=b1242496*est
newspaper article
720
book article
Verification of new 1000 [degree] C tester designed for investigation of wear-corrosion properties of advanced materials for high temperature applications
Antonov, Maksim
;
Hussainova, Irina
;
Kimmari, Eduard
;
Juhani, Kristjan
Proceedings of the 6th International Conference of DAAAM Baltic "Industrial Engineering" : 24-26th April 2008, Tallinn, Estonia. [2]
2008
/
p. 395-399 : ill
http://innomet.ttu.ee/daaam08/online/Materials%20Engineering/Antonov.pdf
book article
721
book article
Verification of the test quality
Matrosova, Anjela
;
Bochun, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 307-310: ill
book article
722
book article
Verification, testing and validation of rule-based expert systems
Tepandi, Jaak
Preprints 11th IFAC World Congress "Automatic Control in the Service of Mankind" : Tallinn, Estonia, USSR, August 13-17, 1990. Vol. 7
1990
/
p. 162-167
book article
723
book article
VHDL based test generation system
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998
1998
/
p. 145-148
book article
724
book article
VHDL design debug framework based on zamiaCAD
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2013 : Design Automation and Test in Europe, March 18-22, 2013, Grenoble, France
2013
/
[1] p. : ill
book article
725
book article
VILAB test generation tools running under the MOSCITO system
Schneider, Andre
;
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum : Györ, Hungary, 2001
2001
/
[12] p
book article
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