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576

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zamiaCAD : understand, develop and debug hardware designsJenihhin, Maksim; Tihhomirov, Valentin; Saif Abrar, Syed; Raik, Jaan; Bartsch, GünterDUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany2014 / p. 1-6

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577

newspaper article

Tallinna kooli õpilased lõid Baltikumi esimese keskkonnasõbralike filtritega õhupuhastiÕigus, Birgitmoodnekodu.delfi.ee2023 Tallinna kooli õpilased lõid Baltikumi esimese keskkonnasõbralike filtritega õhupuhasti

newspaper article

578

newspaper article

Tallinnas avati NATO DIANA piirkondlik keskusEesti Elu : [Kanada ajaleht]2024 / lk. 2

newspaper article

579

newspaper article

TalTech käivitab 5G testvõrgud. Eesti firmad saavad arendada teenuseid välisturgudeleKald, Indrekituudised.ee2023 TalTech käivitab 5G testvõrgud. Eesti firmad saavad arendada teenuseid välisturgudele

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580

newspaper article

TalTechis hakatakse testima 6G võrku. Margus Rohtla: „Oleks vaid minu õpingute ajal sellised võimalused olnud!“Lindpere, Elle Isabelforte.delfi.ee2023 TalTechis hakatakse testima 6G võrku. Margus Rohtla: „Oleks vaid minu õpingute ajal sellised võimalused olnud!“

newspaper article

581

book article

Targeting conditional operations in sequential test pattern generationRaik, Jaan; Ubar, Raimund-Johannes9th European Test Symposium : ETS'04 : Congress Center, Ajaccio, Corsica, France,May 23-26, 20042004 / p. 17-18 : ill https://www.researchgate.net/publication/239717327_Targeting_Conditional_Operations_in_Sequential_Test_Pattern_Generation

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582

journal article

Tarkvara omaduste parandamine kasutatavuse testimise kauduEessaar, ErkiA & A1999 / 2, lk. 26-31

journal article

583

journal article

Tarkvara testimisest ja testijatest EestisMarkvardt, MailiA & A2010 / 3, lk. 62-65

journal article

584

book article

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

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585

book article

Teaching digital RT-level self-test using a Java appletDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 322-328 : ill

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586

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

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587

book article

Teaching digital test with BIST analyzerJutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 123-128 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610171

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588

book article

Teaching test and design for testability with TURBO-TESTER softwareJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 19961996 / p. 589-594

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589

journal article

Tehnikaülikoolis on uus katseseade, mis võib välja panna Abramsi tanki kaaluEhitaja2023 / lk. 35 : fot https://www.ester.ee/record=b1072123*est https://artiklid.elnet.ee/record=b2904596*est

journal article

590

book article

Temporally extended high-level decision diagrams for PSL assertions simulationJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy2008 / p. 61-68 : ill https://ieeexplore.ieee.org/document/4556029

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591

book article

Tension stiffening model based on test data of RC beamsIdnurm, Siim; Bacinskas, Darius; Gribniak, Viktor; Sokolov, Aleksandr; Kaklauskas, GintarisThe 10th International Conference "Modern Building Materials, Structures and Techniques" : May 19-21, 2010, Lithuania : selected papers2010 / p. 810-814 : ill https://www.researchgate.net/publication/265635200_Tension-stiffening_model_based_on_test_data_of_RC_beams

book article

592

journal article

10th IEEE European Test SymposiumUbar, Raimund-Johannes; Prinetto, Paolo; Raik, JaanIEEE journal of design & test of computers2005 / p. 480-481 : phot http://dx.doi.org/10.1109/MDT.2005.106

journal article

593

book article

"Tervis ruudus", ehk, Tippkeskuse CEBE luguUbar, Raimund-JohannesTeadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]2019 / lk. 200-215 : ill., fot https://www.ester.ee/record=b5208765*est

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594

book article

Test cost minimization for hybrid BISTJervan, Gert; Peng, Zebo; Ubar, Raimund-JohannesIEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings2000 / p. 283-298 : ill https://ieeexplore.ieee.org/abstract/document/887168

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595

book article

Test development and deployment tool-set for mixed-signal and digital devicesMellik, Andres; Raik, JaanBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 163-166 : ill

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596

book article

Test driven domain modellingPiho, Gunnar; Tepandi, Jaak; Parman, Marko; Puusep, Viljam; Roost, MartMIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings2011 / p. 576-581 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121

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597

book article

Test generation for control faults in digital systemsDušina, Julia; Brik, MarinaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 325-330: ill

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598

book article

Test generation for digital systemsUbar, Raimund-JohannesDigest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy1983 / p. 374-377

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599

book article

Test generation for digital systems at functional levelUbar, Raimund-Johannes; Kuchcinski, Ktzysztof; Peng, Z.Research report LiTH-IDA-R-90-06, Linköping University, Sweden1990 / p. 1-21

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600

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Test generation for finite state machinesUbar, Raimund-Johannes; Brik, MarinaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 233-236: ill

book article

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