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testimine (subject term)
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151
book article
Fast fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 35-40
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0
book article
152
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
153
book article
Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
2002
/
p. 445-448 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046190
https://ieeexplore.ieee.org/document/1046190
book article
154
book article
Fast test cost calculation for hybrid BIST in digital systems
Orasson, Elmet
;
Raidma, Rein
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Peng, Zebo
Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings
2001
/
p. 318-325 : ill
https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
book article
155
journal article
Fast test pattern generation for sequential circuits using decision diagram representations
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2000
/
3, p. 213-226 : ill
https://link.springer.com/article/10.1023/A:1008335130158
journal article
156
book article
Fault collapsing with linear complexity in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of 2010 IEEE International Symposium on Circuits and Systems (ISCAS 2010) : 30 May - 2 June 2010, Paris, France
2010
/
p. 653-656 : ill
https://ieeexplore.ieee.org/document/5537504
book article
157
journal article
Fault effect reasoning in digital systems by topological view on low- and high-level decision diagrams
Ubar, Raimund-Johannes
Вестник Томского государственного университета. Управление, вычислительная техника и информатика
2014
/
p. 99-113 : ill
http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107
journal article
158
book article
Fault oriented test pattern generation for sequential circuits using genetic algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 319-320
book article
159
dissertation
Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagramme
Reinsalu, Uljana
2013
https://www.ester.ee/record=b2963595*est
dissertation
160
dissertation
Fault simulation of digital systems = Digitaalsüsteemide rikete simuleerimine
Devadze, Sergei
2009
https://digi.lib.ttu.ee/i/?445
https://www.ester.ee/record=b2508727*est
dissertation
161
book article
Fenoolide ning klorofenoolide osoonimise produktide toksilisuse uurimine Daphnia magna testiga
Trapido, Marina
;
Veressinina, Jelena
XXIII Eesti keemiapäevad : teaduskonverentsi ettekannete referaadid
1997
/
lk. 140
book article
162
book article
Field work in the role of teaching and research of rock properties
Karu, Veiko
;
Kolats, Margit
;
Väizene, Vivika
;
Anepaio, Ain
;
Valgma, Ingo
5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 2008
2008
/
p. 66-70 : ill
book article
163
journal article EST
/
journal article ENG
Fire tests on glued-laminated timber beams with specific local material properties
Fahrni, Reto
;
Klippel, Michael
;
Just, Alar
;
Ollinoc, A.
;
Frangi, Andrea
Fire safety journal
2019
/
p. 161-169 : ill
https://doi.org/10.1016/j.firesaf.2017.11.003
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
164
book article
Fire-separating assemblies
Werther, Norman
;
Dagenais, Christian
;
Just, Alar
;
Wade, Colleen
Fire safe use of wood in buildings : global design guide
2022
/
p. 193-226 : ill
https://doi.org/10.1201/9781003190318-6
book article
165
book article
First results from a benchmarking of quality control frameworks
Kedar, A.
;
Sein, Sander
Life cycle analysis and assessment in civil engineering: towards an integrated vision : proceedings of the Sixth International Symposium on Life-Cycle Civil Engineering (IALCCE 2018), 28-31 October 2018, Ghent, Belgium
2019
/
p. 1799−1804 : ill
https://www.taylorfrancis.com/books/9781351857574
book article
166
journal article EST
/
journal article ENG
FOPID controllers and their industrial applications: a survey of recent results
Tepljakov, Aleksei
;
Alagoz, Baris Baykant
;
Petlenkov, Eduard
IFAC-PapersOnLine
2018
/
p. 25-30
https://doi.org/10.1016/j.ifacol.2018.06.014
Conference proceedings at Scopus
Article at Scopus
Article at WOS
journal article EST
/
journal article ENG
167
book
Formal Techniques for Networked and Distributed Systems - FORTE 2007 : 27th IFIP WG 6.1 International Conference : Tallinn, Estonia, June 27-29, 2007 : proceedings
Derrick, John
;
Vain, Jüri
2007
https://www.ester.ee/record=b2286028*est
book
168
dissertation
FPGA-based embedded virtual instrumentation = FPGA-sisesed virtuaalsed test- ja mõõtevahendid
Aleksejev, Igor
2013
http://www.ester.ee/record=b2927687*est
dissertation
169
journal article
FPGA-based fault emulation of synchronous sequential circuits
Ellervee, Peeter
;
Raik, Jaan
;
Tammemäe, Kalle
;
Ubar, Raimund-Johannes
IET computers and digital techniques
2007
/
2, p. 70-76 : ill
https://ieeexplore.ieee.org/abstract/document/1423822
journal article
170
journal article
Fracture micromechanism of Cu-Cr-Zr system by "in-situ tensile test in SEM"
Besterci, Michal
;
Ivan, Jozef
;
Kulu, Priit
;
Arensburger, Daniil
;
Velgosova, Oksana
Acta metallurgica Slovaca
2000
/
p. 20-24
journal article
171
book article
A framework for improving web application user interfaces through immediate evaluation
Marenkov, Jevgeni
;
Robal, Tarmo
;
Kalja, Ahto
Databases and information systems IX : selected papers from the twelfth International Baltic Conference, DB&IS 2016
2016
/
p. 283-296 : ill
https://doi.org/10.3233/978-1-61499-714-6-283
book article
172
book article
Fully synchronized acoustomechanical testing of skin : biomechanical measurements of nonclassical nonlinear parameters
Lints, Martin
;
Dos Santos, Serge
;
Kozena, Colette
;
Kus, Vaclav
;
Salupere, Andrus
24th International Congress on Sound and Vibration 2017 (ICSV 24) : London, United Kingdom, 23-27 July 2017. Vol. 3
2017
/
p. 1970-1977 : ill
https://www.iiav.org/archives_icsv_last/2017_icsv24/content/papers/papers/full_paper_867_20170403135841549.pdf
book article
173
journal article
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
http://dx.doi.org/10.1016/j.micpro.2014.11.002
journal article
174
book article
Functional test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
;
Jutman, Artur
;
Raik, Jaan
;
Bengtsson, Tomas
;
Kumar, Shashi
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 205-208 : ill
book article
175
book article
Generating optimal test cases for real-time systems using DIVINE model checker
Pal, Deepak
;
Vain, Jüri
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 99-102 : ill
http://www.ester.ee/record=b2150914*est
book article
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