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testimine (subject term)
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126
book article EST
/
book article ENG
Energy-efficient multi-fragment Markov model guided online model-based testing for MPSoC
Vain, Jüri
;
Tsiopoulos, Leonidas
;
Kharchenko, Vyacheslav
;
Apneet Kaur
;
Jenihhin, Maksim
;
Raik, Jaan
;
Nõmm, Sven
Green IT Engineering: Social, Business and Industrial Applications
2019
/
p. 273-297
https://doi.org/10.1007/978-3-030-00253-4_12
Article collection at Scopus
Article at Scopus
book article EST
/
book article ENG
127
journal article
Environment for the analysis of functional self-test quality in digital systems
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Kruus, Helena
;
Aarna, Margit
;
Devadze, Sergei
Proceedings of the Estonian Academy of Sciences
2014
/
p. 151-162 : ill
https://artiklid.elnet.ee/record=b2673964*est
journal article
128
book article
Erosion testing of refractory cermets at high temperature [Electronic resource]
Maksim, Antonov
;
Hussainova, Irina
Proceedings of 12th Nordic Symposium in Tribology : NORDTRIB 2006 : Helsingor, Denmark, 7-9 June 2006
2006
/
[10] p. [CD-ROM]
book article
129
journal article
Erosive wear of boiler steels by sand and ash
Huttunen-Saarivirta, E.
;
Kinnunen, H.
;
Tuiremo, J.
;
Uusitalo, M.
;
Antonov, Maksim
Wear
2014
/
p. 213-224 : ill
journal article
130
journal article EST
/
journal article ENG
Erratum: Cognitive disorders in patients with chronic kidney disease: specificities of clinical assessment (Nephrol Dial Transplant DOI: 10.1093/ndt/gfab262)
Pépin, Marion
;
Ferreira, Ana Carina
;
Arici, Mustafa
;
Bachmann, Maie
;
Barbieri, Michelangela
;
Bumblyte, Inga Arune
;
Carriazo, Sol
;
Delgado, Pilar
;
Garneata, Liliana
;
Giannakou, Konstantinos
Nephrology dialysis transplantation
2022
/
1 p
https://doi.org/10.1093/ndt/gfab339
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
131
journal article
Ettevõtted saavad tooteid ja teenuseid testida TalTechi asjade interneti ja 5G platvormil
Mente et Manu
2020
/
lk. 11
https://dea.digar.ee/cgi-bin/dea?a=is&oid=AKmenteetmanu202011&type=staticpdf
journal article
132
book
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
Cantarella, JD
2005
https://www.ester.ee/record=b2300865*est
book
133
book article EST
/
book article ENG
Evaluating cybersecurity-related competences through serious games
Mäses, Sten
19th Koli Calling Conference on Computing Education Research Koli Calling 2019 : November 21-24, 2019, Koli, Finland : proceedings
2019
/
2 p
https://doi.org/10.1145/3364510.3366163
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
134
journal article
Evaluation of some mechanical and physical properties of ‘Oriented Strand Board (OSB/3)’ following cyclic accelerated aging tests
Lille, Harri
;
Kiviste, Mihkel
;
Telling, Renar
;
Leppik, Taimo
;
Virro, Indrek
;
Kask, Regino
European Journal of Wood and Wood Products
2022
/
p. 731–740
https://doi.org/10.1007/s00107-022-01803-9
journal article
135
book article
Evolutionary approach to the functional test generation for digital circuits
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 229-232 : ill
book article
136
book article
Executable black-box tester model synthesis from a non-deterministic EFSM of the system
Kull, Andres
;
Raiend, Kullo
;
Vain, Jüri
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 105-108
book article
137
book article
Experiences of lexicographers and computer scientists in validating Estonian Wordnet with test patterns
Lohk, Ahti
;
Orav, Heili
;
Vare, Kadri
;
Võhandu, Leo
Proceedings of the Eighth Global WordNet Conference : Bucharest, Romania, January 27-30, 2016
2016
/
p. 184-191 : ill
http://gwc2016.racai.ro/
book article
138
book article
Experiences with steady-state PMU compliance testing using standard relay testing equipment
Almas, Muhammad Shoaib
;
Kilter, Jako
;
Vanfretti, Luigi
PQ2014 : the 9th International 2014 Electric Power Quality and Supply Reliability Conference (PQ) : June 11-13, 2014, Rakvere, Estonia : proceedings
2014
/
p. 103-110 : ill
book article
139
book article
Experimental determination of equivalent circuit parameters for a synchronous generator
Naseer, Muhammad Usman
;
Asad, Bilal
;
Ghahfarokhi, Payam Shams
;
Kallaste, Ants
;
Vaimann, Toomas
;
Rassõlkin, Anton
2021 IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream): proceedings of the conference, April 22, 2021, Vilnius, Lithuania
2021
/
7 p. : ill
https://doi.org/10.1109/eStream53087.2021.9431442
book article
140
journal article
Experimental determination of sound transmission in turbo-compressors : SAE Tech. paper no.2009-01-2045
Rämmal, Hans
;
Abom, Mats
SAE Technical Papers
2009
/
[7] p
https://www.diva-portal.org/smash/record.jsf?pid=diva2%3A750030&dswid=-9882
journal article
141
book article EST
/
book article ENG
Experimental testing of exterior wall mounted mechanical ventilation exhaust air outlet devices
Palmiste, Ülar
;
Meier, Tauno
;
Kurnitski, Jarek
;
Voll, Hendrik
E3S Web Conference: Cold Climate HVAC and Energy 2021
2021
/
art. 02001, 8 p. : ill
https://doi.org/10.1051/e3sconf/202124602001
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
142
book article
An external diagnosis method for network-on-a-chip
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France
2007
/
[2] p. : ill
book article
143
book article
Fast extended test access via JTAG and FPGAs
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings
2009
/
p. 1-7 : ill
http://dx.doi.org/10.1109/TEST.2009.5355668
book article
144
book article
Fast fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 35-40
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=a6eb712498a5f23db3f95ad66bada257c21e96f0
book article
145
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
146
book article
Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods
Raik, Jaan
;
Jutman, Artur
;
Ubar, Raimund-Johannes
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
2002
/
p. 445-448 : ill
http://dx.doi.org/10.1109/ICECS.2002.1046190
https://ieeexplore.ieee.org/document/1046190
book article
147
journal article
Fast test pattern generation for sequential circuits using decision diagram representations
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2000
/
3, p. 213-226 : ill
https://link.springer.com/article/10.1023/A:1008335130158
journal article
148
journal article
Fault effect reasoning in digital systems by topological view on low- and high-level decision diagrams
Ubar, Raimund-Johannes
Вестник Томского государственного университета. Управление, вычислительная техника и информатика
2014
/
p. 99-113 : ill
http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107
journal article
149
book article
Fault oriented test pattern generation for sequential circuits using genetic algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 319-320
book article
150
dissertation
Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagramme
Reinsalu, Uljana
2013
https://www.ester.ee/record=b2963595*est
dissertation
Number of records 491, displaying
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