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Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy (title)

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Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopyKask, Erkki; Grossberg, Maarja; Josepson, Raavo; Salu, Pille; Timmo, Kristi; Krustok, JüriMaterials science in semiconductor processing2013 / p. 992-996 : ill https://doi.org/10.1016/j.mssp.2013.02.009 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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