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A global methodology for test program generation starting from high level specifications (title)
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book article
A global methodology for test program generation starting from high level specifications
Storojev, Sergei
;
Leveugle, Regis
;
Saucier, Gabriele
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 305-311: ill
https://www.ester.ee/record=b2150914*est
book article
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keyword
9
1.
high-level test data generation
2.
automatic test program generation
3.
test program generation
4.
behaviour level test generation
5.
Hierarchical Multi-level Test Generation
6.
high-level synthesis for test
7.
logic level and high level BDDs
8.
level(s) methodology
9.
extreme penetration level of non synchronous generation
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