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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program management
34. program packages
35. program transformation
36. program verification
37. SNAP program
38. stufy program
39. Activity-based demand generation
40. automated code generation
41. automatic code generation
42. Automatic generation control
43. automatic GUI model generation
44. building and urban form generation
45. business model generation
46. code generation
47. data set generation
48. decentralized key generation
49. disaster alert generation
50. distributed electricity generation
51. distributed generation
52. Distributed Generation (DG)
53. distributed generation systems
54. distributed power generation
55. distrubuted power generation
56. droplet generation
57. droplet generation rate control
58. electric power generation
59. electricity generation
60. energy generation
61. extreme penetration level of non synchronous generation
62. feasible path generation
63. fifth generation computer
64. fourth generation district heating
65. frequent item generation
66. generation
67. generation and transmission expansion planning
68. Generation Costs
69. generation of electric energy
70. generation scheduling
71. generation succession
72. heat generation
73. hydroelectric power generation
74. hydrogen generation
75. I–III generation
76. job generation
77. knowledge generation
78. multisine generation
79. next generation 4D printing
80. next generation sequencing
81. Next-generation probiotics
82. next-generation sequencing
83. oil-shale power generation
84. pattern Generation
85. photovoltaic (PV) generation
86. photovoltaic generation dispatch
87. power generation
88. power generation dispatch
89. power generation economics
90. power generation planning
91. PV generation
92. PV power generation
93. Renewable energy generation
94. renewable generation
95. residual generation
96. rule generation
97. Second generation bioethanol
98. second generation of tribology models
99. second generation sequencing
100. signal generation
101. silver generation
102. sixth-generation (6G)
103. solar power generation
104. space generation advisory council
105. template based sql generation
106. trajectory generation
107. waste generation
108. wave generation
109. white light generation
110. wind energy generation
111. wind generation
112. wind power generation
113. 16S rRNA gene amplicon next-generation sequencing
114. 4GDH (4th generation district heating)
115. 4th generation district heating
116. 5th generation district heating
117. accelerated shelf-life test
118. antigen test
119. Applications in Test Engineering
120. ASTM G65 dry sand rubber wheel abrasion test
121. Automated Synthesis of Software-based Self-test
122. automated test environment
123. Auvergne test-bed
124. battery test
125. behavioral test
126. bending test
127. bit-error rate test
128. Board and System Test
129. board test
130. bounds test
131. built-in self-test
132. capillary condensation redistribution test
133. chi-square test
134. closed bottle test
135. cognitive screening test
136. compartment fire test
137. compartment test
138. cone penetration test (CPT)
139. COVID-19 antigen test
140. cutting test
141. cybersecurity test bed
142. DDR4 interconnect test
143. design and test
144. design-for-test
145. deterministic test sequences
146. diagnostic test
147. digital test
148. Digital test and testable design
149. double-pulse test
150. drawing test
151. dry droplet antimicrobial test
152. embedded test
153. fan pressurisation test
154. final test result prediction
155. four-point bending test
156. FPGA based test
157. FPGA-Assisted Test
158. FPGA-centric test
159. functional self-test
160. Granger causality test
161. hardness test
162. high-level synthesis for test
163. high-speed serial link test
164. IEEE 9 bus test system
165. in situ tensile test in SEM
166. industrial field test
167. in-situ tensile test in SEM
168. Johansen cointegration test
169. Kolmogorov-Smirnov test
170. load test
171. logic built-in self-test
172. Luria alternating series test
173. Mann–Kendall test
174. Mann-Kendall trend test
175. memory interconnect test
176. microprocessor test
177. Model test
178. multiplier test
179. orthogonal test
180. package test analysis
181. parallel design and test
182. performance test
183. piezocone penetration test (CPTu)
184. Point Load Test index
185. pressurisation test
186. processor-centric board test
187. progressive damage test
188. pseudo-exhaustive test
189. purity test
190. real-time room temperature test
191. rolling thin film oven test
192. rtioco-based timed test sequences
193. seasonal Mann Kendall test
194. seismic piezocone penetration test
195. self-test
196. self-test architectures
197. sentence writing test
198. serial sevens test
199. ship towing test tank
200. similar material simulation test
201. small-scale fire test
202. small‐scale test
203. software based self-test
204. software-based self-test
205. software-based self-test (SBST)
206. soil phosphorus (P) test
207. standard test method
208. static load test
209. static-dynamic probing test (SDT)
210. stress test
211. system level test
212. teaching design and test of systems
213. tensile test
214. tensile test
215. test
216. test and evaluation platform
217. test automation
218. test bench
219. test coverage
220. test driven development
221. test driven modelling
222. test embankment
223. test equipment
224. test groups
225. test model design
226. test optimization
227. test packets
228. test path synthesis
229. test patterns
230. test point insertion
231. test reference year
232. test replication
233. test scenario description language
234. test-bed
235. test-chips
236. test-house
237. test-pattern
238. test-suite reduction
239. Three-point bending test
240. unit root test
241. usability platform test
242. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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