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test program generation (keyword)
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1
book article
A new measure for calculating multiple fault coverage of microprocessor self-test
Oyeniran, Adeboye Stephen
;
Odozi, Uzochukwu Eddie
;
Ubar, Raimund-Johannes
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 75-78 : ill
http://www.ester.ee/record=b2150914*est
book article
2
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
3
journal article
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
https://artiklid.elnet.ee/record=b2665215*est
journal article
4
book article
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
Number of records 4, displaying
1 - 4
keyword
220
1.
automatic test program generation
2.
test program generation
3.
adaptive test strategy generation
4.
automated test pattern generation
5.
automatic test case generation
6.
automatic test pattern generation
7.
behaviour level test generation
8.
functional test generation
9.
high-level test data generation
10.
highlevel test generation
11.
implementation-independent test generation
12.
offline test generation
13.
provably correct test generation
14.
test generation
15.
test generation and fault diagnosis
16.
Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
17.
Apollo program
18.
automatic program synthesis
19.
Baltic-wide HELCOM COMBINE monitoring program
20.
college program
21.
master program
22.
monitoring program
23.
NATO. Science for Peace and Security Program
24.
probabilistic relational program logic
25.
program
26.
program analysis
27.
program equivalence
28.
program management
29.
program packages
30.
program transformation
31.
program verification
32.
SNAP program
33.
stufy program
34.
Activity-based demand generation
35.
automatic code generation
36.
Automatic generation control
37.
automatic GUI model generation
38.
building and urban form generation
39.
business model generation
40.
code generation
41.
disaster alert generation
42.
distributed electricity generation
43.
distributed generation
44.
Distributed Generation (DG)
45.
distributed generation systems
46.
distributed power generation
47.
distrubuted power generation
48.
droplet generation
49.
droplet generation rate control
50.
electric power generation
51.
electricity generation
52.
energy generation
53.
extreme penetration level of non synchronous generation
54.
feasible path generation
55.
fifth generation computer
56.
fourth generation district heating
57.
frequent item generation
58.
generation
59.
generation and transmission expansion planning
60.
Generation Costs
61.
generation of electric energy
62.
generation succession
63.
heat generation
64.
hydroelectric power generation
65.
hydrogen generation
66.
I–III generation
67.
job generation
68.
multisine generation
69.
next generation 4D printing
70.
next generation sequencing
71.
Next-generation probiotics
72.
next-generation sequencing
73.
oil-shale power generation
74.
pattern Generation
75.
photovoltaic (PV) generation
76.
photovoltaic generation dispatch
77.
power generation
78.
power generation dispatch
79.
power generation economics
80.
power generation planning
81.
PV generation
82.
PV power generation
83.
Renewable energy generation
84.
renewable generation
85.
residual generation
86.
Second generation bioethanol
87.
second generation of tribology models
88.
second generation sequencing
89.
silver generation
90.
solar power generation
91.
space generation advisory council
92.
template based sql generation
93.
trajectory generation
94.
waste generation
95.
wave generation
96.
white light generation
97.
wind energy generation
98.
wind generation
99.
wind power generation
100.
16S rRNA gene amplicon next-generation sequencing
101.
4GDH (4th generation district heating)
102.
4th generation district heating
103.
5th generation district heating
104.
accelerated shelf-life test
105.
antigen test
106.
ASTM G65 dry sand rubber wheel abrasion test
107.
automated test environment
108.
Auvergne test-bed
109.
battery test
110.
behavioral test
111.
bending test
112.
bit-error rate test
113.
Board and System Test
114.
board test
115.
bounds test
116.
built-in self-test
117.
capillary condensation redistribution test
118.
chi-square test
119.
closed bottle test
120.
cognitive screening test
121.
compartment fire test
122.
compartment test
123.
cone penetration test (CPT)
124.
COVID-19 antigen test
125.
cutting test
126.
cybersecurity test bed
127.
DDR4 interconnect test
128.
design and test
129.
design-for-test
130.
deterministic test sequences
131.
diagnostic test
132.
digital test
133.
Digital test and testable design
134.
double-pulse test
135.
drawing test
136.
dry droplet antimicrobial test
137.
embedded test
138.
fan pressurisation test
139.
final test result prediction
140.
four-point bending test
141.
FPGA based test
142.
FPGA-Assisted Test
143.
FPGA-centric test
144.
functional self-test
145.
Granger causality test
146.
hardness test
147.
high-level synthesis for test
148.
high-speed serial link test
149.
IEEE 9 bus test system
150.
in situ tensile test in SEM
151.
industrial field test
152.
in-situ tensile test in SEM
153.
Johansen cointegration test
154.
Kolmogorov-Smirnov test
155.
load test
156.
logic built-in self-test
157.
Luria alternating series test
158.
Mann–Kendall test
159.
memory interconnect test
160.
microprocessor test
161.
Model test
162.
multiplier test
163.
orthogonal test
164.
package test analysis
165.
parallel design and test
166.
performance test
167.
piezocone penetration test (CPTu)
168.
Point Load Test index
169.
pressurisation test
170.
processor-centric board test
171.
progressive damage test
172.
pseudo-exhaustive test
173.
purity test
174.
rtioco-based timed test sequences
175.
seasonal Mann Kendall test
176.
seismic piezocone penetration test
177.
self-test
178.
self-test architectures
179.
sentence writing test
180.
serial sevens test
181.
ship towing test tank
182.
similar material simulation test
183.
small‐scale test
184.
software based self-test
185.
software-based self-test
186.
software-based self-test (SBST)
187.
soil phosphorus (P) test
188.
standard test method
189.
static load test
190.
static-dynamic probing test (SDT)
191.
stress test
192.
system level test
193.
teaching design and test of systems
194.
tensile test
195.
test
196.
test and evaluation platform
197.
test bench
198.
test coverage
199.
test driven development
200.
test driven modelling
201.
test embankment
202.
test equipment
203.
test groups
204.
test model design
205.
test optimization
206.
test packets
207.
test path synthesis
208.
test patterns
209.
test point insertion
210.
test reference year
211.
test replication
212.
test scenario description language
213.
test-bed
214.
test-chips
215.
test-house
216.
test-pattern
217.
test-suite reduction
218.
Three-point bending test
219.
unit root test
220.
1995 ECC benchmark test
subject term
3
1.
PHARE (programm). Farm Environmental Managing Program projekt)
2.
European Test Symposium (ETS)
3.
16PF (test)
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