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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article
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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program management
34. program packages
35. program transformation
36. program verification
37. SNAP program
38. stufy program
39. Activity-based demand generation
40. automated code generation
41. automatic code generation
42. Automatic generation control
43. automatic GUI model generation
44. building and urban form generation
45. business model generation
46. code generation
47. data set generation
48. decentralized key generation
49. disaster alert generation
50. distributed electricity generation
51. distributed generation
52. Distributed Generation (DG)
53. distributed generation systems
54. distributed power generation
55. distrubuted power generation
56. droplet generation
57. droplet generation rate control
58. electric power generation
59. electricity generation
60. energy generation
61. extreme penetration level of non synchronous generation
62. feasible path generation
63. fifth generation computer
64. food waste generation
65. fourth generation district heating
66. frequent item generation
67. generation
68. generation and transmission expansion planning
69. Generation Costs
70. generation of electric energy
71. generation scheduling
72. generation succession
73. heat generation
74. hydroelectric power generation
75. hydrogen generation
76. I–III generation
77. job generation
78. knowledge generation
79. multisine generation
80. next generation 4D printing
81. next generation sequencing
82. Next-generation probiotics
83. next-generation sequencing
84. oil-shale power generation
85. pattern Generation
86. photovoltaic (PV) generation
87. photovoltaic generation dispatch
88. power generation
89. power generation dispatch
90. power generation economics
91. power generation planning
92. PV generation
93. PV power generation
94. Renewable energy generation
95. renewable generation
96. residual generation
97. rule generation
98. Second generation bioethanol
99. second generation of tribology models
100. second generation sequencing
101. signal generation
102. silver generation
103. sixth-generation (6G)
104. solar power generation
105. space generation advisory council
106. template based sql generation
107. trajectory generation
108. waste generation
109. wave generation
110. white light generation
111. wind energy generation
112. wind generation
113. wind power generation
114. 16S rRNA gene amplicon next-generation sequencing
115. 4GDH (4th generation district heating)
116. 4th generation district heating
117. 5th generation district heating
118. accelerated shelf-life test
119. antigen test
120. Applications in Test Engineering
121. ASTM G65 dry sand rubber wheel abrasion test
122. Automated Synthesis of Software-based Self-test
123. automated test environment
124. Auvergne test-bed
125. battery test
126. behavioral test
127. bending test
128. bit-error rate test
129. Board and System Test
130. board test
131. bounds test
132. built-in self-test
133. capillary condensation redistribution test
134. chi-square test
135. closed bottle test
136. cognitive screening test
137. compartment fire test
138. compartment test
139. cone penetration test (CPT)
140. COVID-19 antigen test
141. cutting test
142. cybersecurity test bed
143. DDR4 interconnect test
144. design and test
145. design-for-test
146. deterministic test sequences
147. diagnostic test
148. digital test
149. Digital test and testable design
150. double-pulse test
151. drawing test
152. dry droplet antimicrobial test
153. embedded test
154. fan pressurisation test
155. final test result prediction
156. four-point bending test
157. FPGA based test
158. FPGA-Assisted Test
159. FPGA-centric test
160. functional self-test
161. Granger causality test
162. hardness test
163. high-level synthesis for test
164. high-speed serial link test
165. IEEE 9 bus test system
166. in situ tensile test in SEM
167. industrial field test
168. in-situ tensile test in SEM
169. Johansen cointegration test
170. Kolmogorov-Smirnov test
171. load test
172. logic built-in self-test
173. Luria alternating series test
174. Mann–Kendall test
175. Mann-Kendall trend test
176. memory interconnect test
177. microprocessor test
178. Model test
179. multiplier test
180. orthogonal test
181. package test analysis
182. parallel design and test
183. performance test
184. piezocone penetration test (CPTu)
185. Point Load Test index
186. pressurisation test
187. processor-centric board test
188. progressive damage test
189. pseudo-exhaustive test
190. purity test
191. real-time room temperature test
192. rolling thin film oven test
193. rtioco-based timed test sequences
194. seasonal Mann Kendall test
195. seismic piezocone penetration test
196. self-test
197. self-test architectures
198. sentence writing test
199. serial sevens test
200. ship towing test tank
201. similar material simulation test
202. small-scale fire test
203. small‐scale test
204. software based self-test
205. software-based self-test
206. software-based self-test (SBST)
207. soil phosphorus (P) test
208. standard test method
209. static load test
210. static-dynamic probing test (SDT)
211. stress test
212. system level test
213. teaching design and test of systems
214. tensile test
215. tensile test
216. test
217. test and evaluation platform
218. test automation
219. test bench
220. test coverage
221. test driven development
222. test driven modelling
223. test embankment
224. test equipment
225. test groups
226. test model design
227. test optimization
228. test packets
229. test path synthesis
230. test patterns
231. test point insertion
232. test reference year
233. test replication
234. test scenario description language
235. test-bed
236. test-chips
237. test-house
238. test-pattern
239. test-suite reduction
240. Three-point bending test
241. unit root test
242. usability platform test
243. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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