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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
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journal article

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

journal article
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book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. college program
23. master program
24. monitoring program
25. NATO. Science for Peace and Security Program
26. probabilistic relational program logic
27. program
28. program analysis
29. program debugging
30. program equivalence
31. program management
32. program packages
33. program transformation
34. program verification
35. SNAP program
36. stufy program
37. Activity-based demand generation
38. automated code generation
39. automatic code generation
40. Automatic generation control
41. automatic GUI model generation
42. building and urban form generation
43. business model generation
44. code generation
45. data set generation
46. decentralized key generation
47. disaster alert generation
48. distributed electricity generation
49. distributed generation
50. Distributed Generation (DG)
51. distributed generation systems
52. distributed power generation
53. distrubuted power generation
54. droplet generation
55. droplet generation rate control
56. electric power generation
57. electricity generation
58. energy generation
59. extreme penetration level of non synchronous generation
60. feasible path generation
61. fifth generation computer
62. fourth generation district heating
63. frequent item generation
64. generation
65. generation and transmission expansion planning
66. Generation Costs
67. generation of electric energy
68. generation succession
69. heat generation
70. hydroelectric power generation
71. hydrogen generation
72. I–III generation
73. job generation
74. multisine generation
75. next generation 4D printing
76. next generation sequencing
77. Next-generation probiotics
78. next-generation sequencing
79. oil-shale power generation
80. pattern Generation
81. photovoltaic (PV) generation
82. photovoltaic generation dispatch
83. power generation
84. power generation dispatch
85. power generation economics
86. power generation planning
87. PV generation
88. PV power generation
89. Renewable energy generation
90. renewable generation
91. residual generation
92. Second generation bioethanol
93. second generation of tribology models
94. second generation sequencing
95. signal generation
96. silver generation
97. solar power generation
98. space generation advisory council
99. template based sql generation
100. trajectory generation
101. waste generation
102. wave generation
103. white light generation
104. wind energy generation
105. wind generation
106. wind power generation
107. 16S rRNA gene amplicon next-generation sequencing
108. 4GDH (4th generation district heating)
109. 4th generation district heating
110. 5th generation district heating
111. accelerated shelf-life test
112. antigen test
113. Applications in Test Engineering
114. ASTM G65 dry sand rubber wheel abrasion test
115. Automated Synthesis of Software-based Self-test
116. automated test environment
117. Auvergne test-bed
118. battery test
119. behavioral test
120. bending test
121. bit-error rate test
122. Board and System Test
123. board test
124. bounds test
125. built-in self-test
126. capillary condensation redistribution test
127. chi-square test
128. closed bottle test
129. cognitive screening test
130. compartment fire test
131. compartment test
132. cone penetration test (CPT)
133. COVID-19 antigen test
134. cutting test
135. cybersecurity test bed
136. DDR4 interconnect test
137. design and test
138. design-for-test
139. deterministic test sequences
140. diagnostic test
141. digital test
142. Digital test and testable design
143. double-pulse test
144. drawing test
145. dry droplet antimicrobial test
146. embedded test
147. fan pressurisation test
148. final test result prediction
149. four-point bending test
150. FPGA based test
151. FPGA-Assisted Test
152. FPGA-centric test
153. functional self-test
154. Granger causality test
155. hardness test
156. high-level synthesis for test
157. high-speed serial link test
158. IEEE 9 bus test system
159. in situ tensile test in SEM
160. industrial field test
161. in-situ tensile test in SEM
162. Johansen cointegration test
163. Kolmogorov-Smirnov test
164. load test
165. logic built-in self-test
166. Luria alternating series test
167. Mann–Kendall test
168. memory interconnect test
169. microprocessor test
170. Model test
171. multiplier test
172. orthogonal test
173. package test analysis
174. parallel design and test
175. performance test
176. piezocone penetration test (CPTu)
177. Point Load Test index
178. pressurisation test
179. processor-centric board test
180. progressive damage test
181. pseudo-exhaustive test
182. purity test
183. rolling thin film oven test
184. rtioco-based timed test sequences
185. seasonal Mann Kendall test
186. seismic piezocone penetration test
187. self-test
188. self-test architectures
189. sentence writing test
190. serial sevens test
191. ship towing test tank
192. similar material simulation test
193. small-scale fire test
194. small‐scale test
195. software based self-test
196. software-based self-test
197. software-based self-test (SBST)
198. soil phosphorus (P) test
199. standard test method
200. static load test
201. static-dynamic probing test (SDT)
202. stress test
203. system level test
204. teaching design and test of systems
205. tensile test
206. test
207. test and evaluation platform
208. test automation
209. test bench
210. test coverage
211. test driven development
212. test driven modelling
213. test embankment
214. test equipment
215. test groups
216. test model design
217. test optimization
218. test packets
219. test path synthesis
220. test patterns
221. test point insertion
222. test reference year
223. test replication
224. test scenario description language
225. test-bed
226. test-chips
227. test-house
228. test-pattern
229. test-suite reduction
230. Three-point bending test
231. unit root test
232. usability platform test
233. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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