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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program logics
34. program management
35. program packages
36. program transformation
37. program verification
38. SNAP program
39. stufy program
40. Activity-based demand generation
41. automated code generation
42. automatic code generation
43. Automatic generation control
44. automatic GUI model generation
45. building and urban form generation
46. business model generation
47. code generation
48. data set generation
49. decentralized key generation
50. disaster alert generation
51. distributed electricity generation
52. distributed generation
53. Distributed Generation (DG)
54. distributed generation systems
55. distributed power generation
56. distrubuted power generation
57. droplet generation
58. droplet generation rate control
59. electric power generation
60. electricity generation
61. energy generation
62. extreme penetration level of non synchronous generation
63. feasible path generation
64. fifth generation computer
65. food waste generation
66. fourth generation district heating
67. frequent item generation
68. generation
69. generation and transmission expansion planning
70. Generation Costs
71. generation of electric energy
72. generation scheduling
73. generation succession
74. heat generation
75. hydroelectric power generation
76. hydrogen generation
77. I–III generation
78. job generation
79. knowledge generation
80. multisine generation
81. next generation 4D printing
82. next generation sequencing
83. Next-generation probiotics
84. next-generation sequencing
85. oil-shale power generation
86. pattern Generation
87. photovoltaic (PV) generation
88. photovoltaic generation dispatch
89. power generation
90. power generation dispatch
91. power generation economics
92. power generation planning
93. PV generation
94. PV power generation
95. Renewable energy generation
96. renewable generation
97. residual generation
98. rule generation
99. Scenario Generation
100. Second generation bioethanol
101. second generation of tribology models
102. second generation sequencing
103. signal generation
104. silver generation
105. sixth-generation (6G)
106. solar power generation
107. space generation advisory council
108. template based sql generation
109. trajectory generation
110. waste generation
111. wave generation
112. WEEE generation
113. white light generation
114. wind energy generation
115. wind generation
116. wind power generation
117. 16S rRNA gene amplicon next-generation sequencing
118. 4GDH (4th generation district heating)
119. 4th generation district heating
120. 5th generation district heating
121. accelerated shelf-life test
122. antigen test
123. Applications in Test Engineering
124. ASTM G65 dry sand rubber wheel abrasion test
125. Automated Synthesis of Software-based Self-test
126. automated test environment
127. Auvergne test-bed
128. battery test
129. behavioral test
130. bending test
131. bit-error rate test
132. Board and System Test
133. board test
134. bounds test
135. built-in self-test
136. capillary condensation redistribution test
137. chi-square test
138. closed bottle test
139. cognitive screening test
140. compartment fire test
141. compartment test
142. cone penetration test (CPT)
143. COVID-19 antigen test
144. cutting test
145. cybersecurity test bed
146. DDR4 interconnect test
147. design and test
148. design-for-test
149. deterministic test sequences
150. diagnostic test
151. digital test
152. Digital test and testable design
153. double-pulse test
154. drawing test
155. dry droplet antimicrobial test
156. Embedded figures test
157. embedded test
158. fan pressurisation test
159. final test result prediction
160. four-point bending test
161. FPGA based test
162. FPGA-Assisted Test
163. FPGA-centric test
164. functional self-test
165. Granger causality test
166. hardness test
167. high-level synthesis for test
168. high-speed serial link test
169. IEEE 9 bus test system
170. in situ tensile test in SEM
171. industrial field test
172. in-situ tensile test in SEM
173. Johansen cointegration test
174. Kolmogorov-Smirnov test
175. load test
176. logic built-in self-test
177. Luria alternating series test
178. Mann–Kendall test
179. Mann-Kendall trend test
180. memory interconnect test
181. microprocessor test
182. Model test
183. multiplier test
184. orthogonal test
185. package test analysis
186. parallel design and test
187. performance test
188. piezocone penetration test (CPTu)
189. Point Load Test index
190. pressurisation test
191. processor-centric board test
192. progressive damage test
193. pseudo-exhaustive test
194. purity test
195. real-time room temperature test
196. rolling thin film oven test
197. rtioco-based timed test sequences
198. seasonal Mann Kendall test
199. seismic piezocone penetration test
200. self-test
201. self-test architectures
202. sentence writing test
203. serial sevens test
204. ship towing test tank
205. similar material simulation test
206. small-scale fire test
207. small‐scale test
208. software based self-test
209. software-based self-test
210. software-based self-test (SBST)
211. soil phosphorus (P) test
212. standard test method
213. static load test
214. static-dynamic probing test (SDT)
215. stress test
216. system level test
217. teaching design and test of systems
218. tensile test
219. tensile test
220. test
221. test and evaluation platform
222. test automation
223. test bench
224. test coverage
225. test driven development
226. test driven modelling
227. test embankment
228. test equipment
229. test groups
230. test model design
231. test optimization
232. test packets
233. test path synthesis
234. test patterns
235. test point insertion
236. test reference year
237. test replication
238. test scenario description language
239. test-bed
240. test-chips
241. test-house
242. test-pattern
243. test-suite reduction
244. Three-point bending test
245. unit root test
246. usability platform test
247. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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