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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

book article
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journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program logics
34. program management
35. program packages
36. program transformation
37. program verification
38. SNAP program
39. stufy program
40. Activity-based demand generation
41. automated code generation
42. automatic code generation
43. Automatic generation control
44. automatic GUI model generation
45. building and urban form generation
46. business model generation
47. code generation
48. data set generation
49. decentralized key generation
50. disaster alert generation
51. distributed electricity generation
52. distributed generation
53. Distributed Generation (DG)
54. distributed generation systems
55. distributed power generation
56. distrubuted power generation
57. droplet generation
58. droplet generation rate control
59. electric power generation
60. electricity generation
61. energy generation
62. extreme penetration level of non synchronous generation
63. feasible path generation
64. fifth generation computer
65. food waste generation
66. fourth generation district heating
67. frequent item generation
68. generation
69. generation and transmission expansion planning
70. Generation Costs
71. generation of electric energy
72. generation scheduling
73. generation succession
74. heat generation
75. hydroelectric power generation
76. hydrogen generation
77. I–III generation
78. job generation
79. knowledge generation
80. multisine generation
81. next generation 4D printing
82. next generation sequencing
83. Next-generation probiotics
84. next-generation sequencing
85. oil-shale power generation
86. pattern Generation
87. photovoltaic (PV) generation
88. photovoltaic generation dispatch
89. power generation
90. power generation dispatch
91. power generation economics
92. power generation planning
93. PV generation
94. PV power generation
95. Renewable energy generation
96. renewable generation
97. residual generation
98. rule generation
99. Scenario Generation
100. Second generation bioethanol
101. second generation of tribology models
102. second generation sequencing
103. signal generation
104. silver generation
105. sixth-generation (6G)
106. solar power generation
107. space generation advisory council
108. template based sql generation
109. trajectory generation
110. waste generation
111. wave generation
112. WEEE generation
113. white light generation
114. wind energy generation
115. wind generation
116. wind power generation
117. 16S rRNA gene amplicon next-generation sequencing
118. 4GDH (4th generation district heating)
119. 4th generation district heating
120. 5th generation district heating
121. accelerated shelf-life test
122. antigen test
123. Applications in Test Engineering
124. ASTM G65 dry sand rubber wheel abrasion test
125. Automated Synthesis of Software-based Self-test
126. automated test environment
127. Auvergne test-bed
128. battery test
129. behavioral test
130. bending test
131. bit-error rate test
132. Board and System Test
133. board test
134. bounds test
135. built-in self-test
136. capillary condensation redistribution test
137. chi-square test
138. closed bottle test
139. cognitive screening test
140. compartment fire test
141. compartment test
142. cone penetration test (CPT)
143. COVID-19 antigen test
144. cutting test
145. cybersecurity test bed
146. DDR4 interconnect test
147. design and test
148. design-for-test
149. deterministic test sequences
150. diagnostic test
151. digital test
152. Digital test and testable design
153. double-pulse test
154. drawing test
155. dry droplet antimicrobial test
156. embedded test
157. fan pressurisation test
158. final test result prediction
159. four-point bending test
160. FPGA based test
161. FPGA-Assisted Test
162. FPGA-centric test
163. functional self-test
164. Granger causality test
165. hardness test
166. high-level synthesis for test
167. high-speed serial link test
168. IEEE 9 bus test system
169. in situ tensile test in SEM
170. industrial field test
171. in-situ tensile test in SEM
172. Johansen cointegration test
173. Kolmogorov-Smirnov test
174. load test
175. logic built-in self-test
176. Luria alternating series test
177. Mann–Kendall test
178. Mann-Kendall trend test
179. memory interconnect test
180. microprocessor test
181. Model test
182. multiplier test
183. orthogonal test
184. package test analysis
185. parallel design and test
186. performance test
187. piezocone penetration test (CPTu)
188. Point Load Test index
189. pressurisation test
190. processor-centric board test
191. progressive damage test
192. pseudo-exhaustive test
193. purity test
194. real-time room temperature test
195. rolling thin film oven test
196. rtioco-based timed test sequences
197. seasonal Mann Kendall test
198. seismic piezocone penetration test
199. self-test
200. self-test architectures
201. sentence writing test
202. serial sevens test
203. ship towing test tank
204. similar material simulation test
205. small-scale fire test
206. small‐scale test
207. software based self-test
208. software-based self-test
209. software-based self-test (SBST)
210. soil phosphorus (P) test
211. standard test method
212. static load test
213. static-dynamic probing test (SDT)
214. stress test
215. system level test
216. teaching design and test of systems
217. tensile test
218. tensile test
219. test
220. test and evaluation platform
221. test automation
222. test bench
223. test coverage
224. test driven development
225. test driven modelling
226. test embankment
227. test equipment
228. test groups
229. test model design
230. test optimization
231. test packets
232. test path synthesis
233. test patterns
234. test point insertion
235. test reference year
236. test replication
237. test scenario description language
238. test-bed
239. test-chips
240. test-house
241. test-pattern
242. test-suite reduction
243. Three-point bending test
244. unit root test
245. usability platform test
246. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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