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book article

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

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book article

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

book article
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journal article

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

journal article
4

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

Number of records 4, displaying 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. high-level test data generation
10. highlevel test generation
11. implementation-independent test generation
12. offline test generation
13. provably correct test generation
14. test generation
15. test generation and fault diagnosis
16. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
17. Apollo program
18. automatic program synthesis
19. Baltic-wide HELCOM COMBINE monitoring program
20. college program
21. master program
22. monitoring program
23. NATO. Science for Peace and Security Program
24. probabilistic relational program logic
25. program
26. program analysis
27. program equivalence
28. program management
29. program packages
30. program transformation
31. program verification
32. SNAP program
33. stufy program
34. Activity-based demand generation
35. automatic code generation
36. Automatic generation control
37. automatic GUI model generation
38. building and urban form generation
39. business model generation
40. code generation
41. disaster alert generation
42. distributed electricity generation
43. distributed generation
44. Distributed Generation (DG)
45. distributed generation systems
46. distributed power generation
47. distrubuted power generation
48. droplet generation
49. droplet generation rate control
50. electric power generation
51. electricity generation
52. energy generation
53. extreme penetration level of non synchronous generation
54. feasible path generation
55. fifth generation computer
56. fourth generation district heating
57. frequent item generation
58. generation
59. generation and transmission expansion planning
60. Generation Costs
61. generation of electric energy
62. generation succession
63. heat generation
64. hydroelectric power generation
65. hydrogen generation
66. I–III generation
67. job generation
68. multisine generation
69. next generation 4D printing
70. next generation sequencing
71. Next-generation probiotics
72. next-generation sequencing
73. oil-shale power generation
74. pattern Generation
75. photovoltaic (PV) generation
76. photovoltaic generation dispatch
77. power generation
78. power generation dispatch
79. power generation economics
80. power generation planning
81. PV generation
82. PV power generation
83. Renewable energy generation
84. renewable generation
85. residual generation
86. Second generation bioethanol
87. second generation of tribology models
88. second generation sequencing
89. signal generation
90. silver generation
91. solar power generation
92. space generation advisory council
93. template based sql generation
94. trajectory generation
95. waste generation
96. wave generation
97. white light generation
98. wind energy generation
99. wind generation
100. wind power generation
101. 16S rRNA gene amplicon next-generation sequencing
102. 4GDH (4th generation district heating)
103. 4th generation district heating
104. 5th generation district heating
105. accelerated shelf-life test
106. antigen test
107. ASTM G65 dry sand rubber wheel abrasion test
108. automated test environment
109. Auvergne test-bed
110. battery test
111. behavioral test
112. bending test
113. bit-error rate test
114. Board and System Test
115. board test
116. bounds test
117. built-in self-test
118. capillary condensation redistribution test
119. chi-square test
120. closed bottle test
121. cognitive screening test
122. compartment fire test
123. compartment test
124. cone penetration test (CPT)
125. COVID-19 antigen test
126. cutting test
127. cybersecurity test bed
128. DDR4 interconnect test
129. design and test
130. design-for-test
131. deterministic test sequences
132. diagnostic test
133. digital test
134. Digital test and testable design
135. double-pulse test
136. drawing test
137. dry droplet antimicrobial test
138. embedded test
139. fan pressurisation test
140. final test result prediction
141. four-point bending test
142. FPGA based test
143. FPGA-Assisted Test
144. FPGA-centric test
145. functional self-test
146. Granger causality test
147. hardness test
148. high-level synthesis for test
149. high-speed serial link test
150. IEEE 9 bus test system
151. in situ tensile test in SEM
152. industrial field test
153. in-situ tensile test in SEM
154. Johansen cointegration test
155. Kolmogorov-Smirnov test
156. load test
157. logic built-in self-test
158. Luria alternating series test
159. Mann–Kendall test
160. memory interconnect test
161. microprocessor test
162. Model test
163. multiplier test
164. orthogonal test
165. package test analysis
166. parallel design and test
167. performance test
168. piezocone penetration test (CPTu)
169. Point Load Test index
170. pressurisation test
171. processor-centric board test
172. progressive damage test
173. pseudo-exhaustive test
174. purity test
175. rtioco-based timed test sequences
176. seasonal Mann Kendall test
177. seismic piezocone penetration test
178. self-test
179. self-test architectures
180. sentence writing test
181. serial sevens test
182. ship towing test tank
183. similar material simulation test
184. small-scale fire test
185. small‐scale test
186. software based self-test
187. software-based self-test
188. software-based self-test (SBST)
189. soil phosphorus (P) test
190. standard test method
191. static load test
192. static-dynamic probing test (SDT)
193. stress test
194. system level test
195. teaching design and test of systems
196. tensile test
197. test
198. test and evaluation platform
199. test bench
200. test coverage
201. test driven development
202. test driven modelling
203. test embankment
204. test equipment
205. test groups
206. test model design
207. test optimization
208. test packets
209. test path synthesis
210. test patterns
211. test point insertion
212. test reference year
213. test replication
214. test scenario description language
215. test-bed
216. test-chips
217. test-house
218. test-pattern
219. test-suite reduction
220. Three-point bending test
221. unit root test
222. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

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