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Hierarchical test generation for complex digital systems with control and data processing parts (title)
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Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
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1.
Hierarchical Multi-level Test Generation
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high-level test data generation
3.
digital control systems
4.
complex event processing
5.
hierarchical control
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