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Hierarchical approach to test generation for digital systems at system, circuit and defect levels (title)
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book article
Hierarchical approach to test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
2000
/
S. 711-716 : Ill
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1.
Hierarchical Multi-level Test Generation
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digital integrated circuit (IC) design
3.
ascending hierarchical grid system
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