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New built-in self-test scheme for SoC interconnect (title)
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book article
New built-in self-test scheme for SoC interconnect
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Raik, Jaan
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
2005
/
p. 19-24 : ill
https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect
book article
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keyword
12
1.
built-in self-test
2.
logic built-in self-test
3.
DDR4 interconnect test
4.
memory interconnect test
5.
Automated Synthesis of Software-based Self-test
6.
functional self-test
7.
self-test
8.
self-test architectures
9.
software based self-test
10.
software-based self-test
11.
software-based self-test (SBST)
12.
Self-assembly and Self-organization
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